Energy concepts involved in MOS characterization
Engström, Olof, Gutt, Tomasz, M. Przewłocki, Henryk
Published in Journal of Telecommunications and Information Technology (01.06.2023)
Published in Journal of Telecommunications and Information Technology (01.06.2023)
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Journal Article
Selected Questions Related to Characterization of MEMS Structures Comprising PZT Piezo Layer
Grabiec, Piotr, Zając, Jerzy, Gutt, Tomasz, Piasecki, Tomasz
Published in Journal of nano research (01.01.2016)
Published in Journal of nano research (01.01.2016)
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Journal Article
Carbonic inclusions on SiC/SiO sub(2 interface investigated with Raman Scattering)
Borowicz, Pawel, Gutt, Tomasz, Malachowski, Tomasz, Latek, Mariusz
Published in Diamond and related materials (01.06.2011)
Published in Diamond and related materials (01.06.2011)
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Journal Article
Carbonic inclusions on SiC/SiO2 interface investigated with Raman Scattering
Borowicz, Paweł, Gutt, Tomasz, Małachowski, Tomasz, Latek, Mariusz
Published in Diamond and related materials (01.05.2011)
Published in Diamond and related materials (01.05.2011)
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Journal Article
Band Diagrams and Trap Distributions in Metal-SiO 2 -SiC(3C) Structures with Different Metal Gates
Przewlocki, Henryk Maria, Gutt, Tomasz, Piskorski, Krzysztof, Bakowski, Mietek
Published in ECS transactions (15.03.2013)
Published in ECS transactions (15.03.2013)
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Journal Article
Investigation of gate edge effect on interface trap density in 3C–SiC MOS capacitors
Gutt, T., Małachowski, T., Przewłocki, H.M., Engström, O., Bakowski, M., Esteve, R.
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.09.2012)
Published in Materials science & engineering. B, Solid-state materials for advanced technology (01.09.2012)
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Journal Article