Reliability of advanced embedded non-volatile memories: The 2T-FNFN device
Guoqiao Tao
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
Published in 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial (01.06.2008)
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Conference Proceeding
Experimental study of carrier transport in multi-layered structures
Tao, Guoqiao, Ouvrard, Cedric, Chauveau, Helene, Nath, Som
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Journal Article
Conference Proceeding
Reliability excellence in SSL manufacturing
Guoqiao Tao
Published in 2015 12th China International Forum on Solid State Lighting (SSLCHINA) (01.11.2015)
Published in 2015 12th China International Forum on Solid State Lighting (SSLCHINA) (01.11.2015)
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Conference Proceeding
Reliability excellence, with a case study of a LED linear module
Guoqiao Tao
Published in 2014 11th China International Forum on Solid State Lighting (SSLCHINA) (01.11.2014)
Published in 2014 11th China International Forum on Solid State Lighting (SSLCHINA) (01.11.2014)
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Conference Proceeding
Vt instability in high bit-count-per-cell Floating-Gate Non-Volatile memories
Jindong Yang, Guoqiao Tao
Published in 2009 IEEE International Integrated Reliability Workshop Final Report (01.10.2009)
Published in 2009 IEEE International Integrated Reliability Workshop Final Report (01.10.2009)
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Conference Proceeding
Modelling of LED light source reliability
Guoqiao Tao
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
Trends and challenges in solid state lighting reliability
Guoqiao Tao
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
Published in Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2013)
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Conference Proceeding
LDMOST gate oxide breakdown prediction under realistic RF power application conditions
Guoqiao Tao, van Nederveen, Sjoerd, de Vaan, Mario
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
Published in 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (01.07.2017)
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Conference Proceeding
Failure early detection in SSL manufacturing
Xiuzhen Liu, Guoqiao Tao
Published in 2016 13th China International Forum on Solid State Lighting (SSLChina) (01.11.2016)
Published in 2016 13th China International Forum on Solid State Lighting (SSLChina) (01.11.2016)
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Conference Proceeding
A simple and accurate method to extract neutral threshold voltage of floating gate flash devices and its application to flash reliability characterization
Guoqiao Tao, Chauveau, H., Boter, D., Dormans, D., Verhaar, R.
Published in 2007 IEEE International Integrated Reliability Workshop Final Report (01.10.2007)
Published in 2007 IEEE International Integrated Reliability Workshop Final Report (01.10.2007)
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Conference Proceeding
On intrinsic failure rate of products with error correction
Guoqiao Tao, Bisschop, J., Nath, S.
Published in 2005 IEEE International Integrated Reliability Workshop (2005)
Published in 2005 IEEE International Integrated Reliability Workshop (2005)
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Conference Proceeding
A quick electrical inspection method of solder joint quality for LED products
Zhang, Jianhua, Que, Xiufu, Liu, Yanan, Chen, Weining, Tao, Guoqiao, Yang, Lianqiao
Published in Measurement science & technology (01.06.2016)
Published in Measurement science & technology (01.06.2016)
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Journal Article
From Lab to Fab: ZERO defect challenges and practices in GaN RF Power mass production phase
Tao, Guoqiao
Published in 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) (23.11.2020)
Published in 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS) (23.11.2020)
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Conference Proceeding
Foreword
Guoqiao Tao
Published in 2009 IEEE International Integrated Reliability Workshop Final Report (01.10.2009)
Published in 2009 IEEE International Integrated Reliability Workshop Final Report (01.10.2009)
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Conference Proceeding
Characterization and modeling of program/erase induced device degradation in 2T-FNFN-NOR flash memories
Guoqiao Tao, Chauveau, H., Boter, D., van der Vegt, E., Dormans, D., Verhaar, R.
Published in 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2008)
Published in 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2008)
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Conference Proceeding
Experimental Study of Charge Displacement in Nitride Layer and its Effect on Threshold Voltage Instability of Advanced Flash Memory Devices
Guoqiao Tao, Som Nath, Ouvrard, C., Chauveau, H., Dormans, D., Verhaar, R.
Published in 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2007)
Published in 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2007)
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Conference Proceeding