by Huamao Lin, Walton, A.J., Dunare, C.C., Stevenson, J., Gundlach, A.M., Smith, S., Bunting, A.S.
Published in IEEE transactions on semiconductor manufacturing (01.05.2008)

by Terry, J.G., Smith, S., Walton, A.J., Gundlach, A.M., Stevenson, J.T.M., Horsfall, A.B., Kai Wang, dos Santos, J.M.M., Soare, S.M., Wright, N.G., O'Neill, A.G., Bull, S.J.
Published in IEEE transactions on semiconductor manufacturing (01.05.2005)

by Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A., Smith, S., Snell, A.J., Stevenson, J., Walton, A.J., Allen, R., Cresswell, M.W.
Published in IEEE transactions on semiconductor manufacturing (01.11.2008)

by Smith, S., Walton, A.J., Bond, S., Ross, A.W.S., Stevenson, J.T.M., Gundlach, A.M.
Published in IEEE transactions on semiconductor manufacturing (01.05.2003)

by AbuGhazaleh, S.A., Christie, P., Agrawal, V., Stevenson, J.T.M., Walton, A.J., Gundlach, A.M., Smith, S.
Published in IEEE transactions on semiconductor manufacturing (01.05.2000)

by Mastropaolo, E., Gundlach, A.M., Fragkiadakis, C., Kirby, P.B., Cheung, R.
Published in Electronics letters (06.12.2007)

by Smith, S, Tang, T B, Terry, J G, Stevenson, J T M, Flynn, B W, Reekie, H M, Murray, A F, Gundlach, A M, Renshaw, D, Dhillon, B, Ohtori, A, Inoue, Y, Walton, A J
Published in IET nanobiotechnology (01.10.2007)

by Lin, H., Stevenson, J.T.M., Gundlach, A.M., Dunare, C.C., Walton, A.J.
Published in Microelectronic engineering (01.05.2008)

by Tang, T B, Smith, S, Flynn, B W, Stevenson, J T M, Gundlach, A M, Reekie, H M, Murray, A F, Renshaw, D, Dhillon, B, Ohtori, A, Inoue, Y, Terry, J G, Walton, A J
Published in IET nanobiotechnology (01.09.2008)

by Lin, H., Smith, S., Stevenson, J.T.M., Gundlach, A.M., Dunare, C.C., Walton, A.J.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)

by Hilton, G.C., Beall, J.A., Doriese, W.B., Duncan, W.D., Ferreira, L.S., Irwin, K.D., Reintsema, C.D., Ullom, J.N., Vale, L.R., Xu, Y., Zink, B.L., Parkes, W., Bunting, A.S., Dunare, C.C., Gundlach, A.M., Stevenson, J.T.M., Walton, A.J., Schulte, E., Corrales, E., Sienicki, J.P., Bintley, Dan, Ade, P.A.R., Sudiwala, Rashmi V., Woodcraft, Adam L., Halpern, Mark, Holland, W., Audley, M.D., MacIntosh, M.
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.04.2006)

by Read, N.D, Kellock, L.J, Collins, T.J, Gundlach, A.M. (Edinburgh Univ. (United Kingdom). Inst. of Cell and Molecular Biology)
Published in Planta (1997)

by Horsfall, A.B., Kai Wang, dos-Santos, J.M.M., Soare, S.M., Bull, S.J., Wright, N.G., O'Neill, A.G., Terry, J.G., Walton, A.J., Gundlach, A.M., Stevenson, J.T.M.
Published in IEEE transactions on device and materials reliability (01.09.2004)

by Read, N.D, Kellock, L.J, Collins, T.J, Gundlach, A.M
Published in Planta (1997)

by Horsfall, A.B., dos Santos, J.M.M., Soare, S.M., Wright, N.G., O’Neill, A.G., Bull, S.J., Walton, A.J., Gundlach, A.M., Stevenson, J.T.M.
Published in Microelectronics and reliability (01.09.2003)

by Seunarine, K, Calton, D.W, Underwood, I, Stevenson, J.T.M, Gundlach, A.M, Begbie, M
Published in Sensors and actuators. A. Physical. (1999)

by Lin, H., Walton, A.J., Dunarc, C.C., Stevenson, J.T.M., Gundlach, A.M., Smith, S., Bunting, A.S.
Published in 2006 IEEE International Conference on Microelectronic Test Structures (2006)

by Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Smith, S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by dos-Santos, J.M.M., Kai Wang, Horsfall, A.B., Pina, J.C.P., Wright, N.G., O'Neill, A.G., Soare, S.M., Bull, S.J., Terry, J.G., Walton, A.J., Gundlach, A.M., Stevenson, J.T.M.
Published in IEEE transactions on device and materials reliability (01.12.2005)

by Shulver, B.J.R., Allen, R.A., Walton, A.J., Cresswell, M.W., Stevenson, J.T.M., Smith, S., Bunting, A.S., Dunare, C., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)