Using Clinical Signs and Symptoms for Medical Management of Radiation Casualties - 2015 NATO Exercise
Dörr, H, Abend, M, Blakely, W F, Bolduc, D L, Boozer, D, Costeira, T, Dant, T, De Amicis, A, De Sanctis, S, Dondey, M, Drouet, M, Entine, F, Francois, S, Gagna, G, Guitard, N, Hérodin, F, Hoefer, M, Lamkowski, A, La Sala, G, Lista, F, Loiacono, P, Majewski, M, Martigne, P, Métivier, D, Michel, X, Pateux, J, Pejchal, J, Reeves, G, Riccobono, D, Sinkorova, Z, Soyez, L, Stricklin, D, Tichy, A, Valente, M, Woodruff, Jr, C R, Zarybnicka, L, Port, M
Published in Radiation research (01.03.2017)
Published in Radiation research (01.03.2017)
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Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology
Galy, Ph, Bourgeat, J., Jimenez, J., Guitard, N., Dray, A., Troussier, G., Jacquier, B., Marin-Cudraz, D.
Published in Microelectronics and reliability (01.09.2012)
Published in Microelectronics and reliability (01.09.2012)
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Application of various optical techniques for ESD defect localization
Essely, F., Darracq, F., Pouget, V., Remmach, M., Beaudoin, F., Guitard, N., Bafleur, M., Perdu, P., Touboul, A., Lewis, D.
Published in Microelectronics and reliability (01.09.2006)
Published in Microelectronics and reliability (01.09.2006)
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Low-Noise Si/SiGe HBT for LEO Satellite User Terminals in Ku-Ka Bands
Gauthier, A., Brezza, E., Montagne, A., Guitard, N., Goncalves, J. Azevedo, Buczko, M., Jan, S., Derrier, N., Celi, D., Deglise-Favre, C., Ma, J., Audouin, H., Deprat, F., Ristoiu, I D., Berthier, L., Clement, L., Grelaud, B., Rougier, C., Chevalier, P.
Published in 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) (16.10.2023)
Published in 2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) (16.10.2023)
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Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements
Gao, Y., Guitard, N., Salamero, C., Bafleur, M., Bary, L., Escotte, L., Gueulle, P., Lescouzeres, L.
Published in Microelectronics and reliability (01.09.2007)
Published in Microelectronics and reliability (01.09.2007)
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Exosomes/EVs: PRIMED MSC-EV: A POTENTIAL NOVEL THERAPEUTIC FOR RADIATION-INDUCED HEMATOPOIETIC SYNDROME
Cavallero, S., Helissey, C., Guitard, N., Thery, H., Riccobono, D., François, S.
Published in Cytotherapy (Oxford, England) (01.05.2023)
Published in Cytotherapy (Oxford, England) (01.05.2023)
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PD-SOI CMOS and SiGe BiCMOS Technologies for 5G and 6G communications
Chevalier, P., Gianesello, F., Pallotta, A., Goncalves, J. Azevedo, Bertrand, G., Borrel, J., Boissonnet, L., Brezza, E., Buczko, M., Canderle, E., Celi, D., Cremer, S., Derrier, N., Diouf, C., Durand, C., Foussadier, F., Garcia, P., Guitard, N., Fleury, A., Gauthier, A., Kermarrec, O., Lajoinie, J., Legrand, C.A., Milon, V., Monsieur, F., Mourier, Y., Muller, D., Ney, D., Paulin, R., Pelloux, N., Renard, C., Rellier, M.L., Scheer, P., Sicard, I., Vulliet, N., Juge, A., Granger, E., Gloria, D., Uginet, J., Garchery, L., Paillardet, F.
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
Published in 2020 IEEE International Electron Devices Meeting (IEDM) (12.12.2020)
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Study of the ESD defects impact on ICs reliability
ESSELY, F, BESTORY, C, GUITARD, N, BAFLEUR, M, WISLEZ, A, DOCHE, E, PERDU, P, TOUBOUL, A, LEWIS, D
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
Guitard, N., Essely, F., Trémouilles, D., Bafleur, M., Nolhier, N., Perdu, P., Touboul, A., Pouget, V., Lewis, D.
Published in Microelectronics and reliability (01.09.2005)
Published in Microelectronics and reliability (01.09.2005)
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A 30.1 mW / \mu m2 SiGe:C HBT Featuring an Implanted Collector in a 55-nm CMOS Node
Gauthier, A., Aouimeur, W., Okada, E., Guitard, N., Chevalier, P., Gaquiere, C.
Published in IEEE electron device letters (01.01.2020)
Published in IEEE electron device letters (01.01.2020)
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A 30.1 mW / [Formula Omitted]m2 SiGe:C HBT Featuring an Implanted Collector in a 55-nm CMOS Node
Gauthier, A, Aouimeur, W, Okada, E, Guitard, N, Chevalier, P, Gaquiere, C
Published in IEEE electron device letters (01.01.2020)
Published in IEEE electron device letters (01.01.2020)
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A 30.1 mW / $\mu$ m 2 SiGe:C HBT Featuring an Implanted Collector in a 55-nm CMOS Node
Gauthier, A., Aouimeur, W., Okada, E., Guitard, N., Chevalier, P., Gaquiere, C.
Published in IEEE electron device letters (01.01.2020)
Published in IEEE electron device letters (01.01.2020)
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Mesenchymal Stem/Stromal Cells: TWO NEW POTENTIAL THERAPEUTIC APPROACHES IN RADIATION CYSTITIS DERIVED FROM MESENCHYMAL STEM CELLS: EXTRACELLULAR VESICLES AND CONDITIONED MEDIUM
Helissey, C., Guitard, N., Théry, H., Goulinet, S., Mauduit, P., Girleanu, M., Favier, A., Drouet, M., Chargari, C., Cavallero, S.
Published in Cytotherapy (Oxford, England) (01.05.2022)
Published in Cytotherapy (Oxford, England) (01.05.2022)
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Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications
GUITARD, N, TREMOUILLES, D, BAFLEUR, M, ESCOTTE, L, BARY, L, PERDU, P, SARRABAYROUSE, G, NOLHIER, N, REYNA-ROJAS, R
Published in Microelectronics and reliability (01.09.2004)
Published in Microelectronics and reliability (01.09.2004)
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Process Optimization for HCI Improvement in I/O Analog Devices
Diouf, C., Guitard, N., Rafik, M., Martinez, J. J., Federspiel, X., Bravaix, A., Muller, D., Roy, D.
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)
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BIMOS transistor and its applications in ESD protection in advanced CMOS technology
Galy, Ph, Jimenez, J., Bourgeat, J., Dray, A., Troussier, G., Heitz, B., Guitard, N., Marin-cudraz, D., Beckrich-Ros, H.
Published in 2012 IEEE International Conference on IC Design & Technology (01.05.2012)
Published in 2012 IEEE International Conference on IC Design & Technology (01.05.2012)
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First demonstration of a full 28nm high-k/metal gate circuit transfer from Bulk to UTBB FDSOI technology through hybrid integration
Golanski, D., Fonteneau, P., Fenouillet-Beranger, C., Cros, A., Monsieur, F., Guitard, N., Legrand, C-A, Dray, A., Richier, C., Beckrich, H., Mora, P., Bidal, G., Weber, O., Saxod, O., Manouvrier, J-R, Galy, P., Planes, N., Arnaud, F.
Published in 2013 Symposium on VLSI Technology (01.06.2013)
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Published in 2013 Symposium on VLSI Technology (01.06.2013)
Conference Proceeding
85 fs RON×COFF and CP1dB@28GHz > 25dBm Innovative PIN Diode Integrated in 55 nm BiCMOS Technology Targeting mmW 5G and 6G Front End Module
Foissey, O., Gianesello, F., Gidel, V., Durand, C., Gauthier, A., Guitard, N., Chevalier, P., Hello, M., Goncalves, J. Azevedo, Gloria, D., Velayudhan, V., Lugo, J.
Published in 2021 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) (17.01.2021)
Published in 2021 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) (17.01.2021)
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