by Guin, Ujjwal, Huang, Ke, DiMase, Daniel, Carulli, John M., Tehranipoor, Mohammad, Makris, Yiorgos
Published in Proceedings of the IEEE (01.08.2014)

by Cui, Pinchen, Dixon, Julie, Guin, Ujjwal, Dimase, Daniel
Published in IEEE access (2019)

by Wang, Wendong, Guin, Ujjwal, Singh, Adit
Published in Journal of electronic testing (01.06.2020)

by Chowdhury, Prattay, Guin, Ujjwal, Singh, Adit D., Agrawal, Vishwani D.
Published in Journal of electronic testing (01.02.2021)

by Zhang, Yuqiao, Jain, Ayush, Cui, Pinchen, Zhou, Ziqi, Guin, Ujjwal
Published in Journal of cryptographic engineering (01.09.2021)

by Mahmod, Md Jubayer al, Guin, Ujjwal
Published in Cryptography (01.03.2020)

by Sadi, Mehdi, Guin, Ujjwal
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.01.2022)

by Zhong, Yadi, Guin, Ujjwal
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.10.2023)

by Zhong, Yadi, Guin, Ujjwal
Published in IEEE transactions on computers (01.08.2023)

by Zhang, Yuqiao, Guin, Ujjwal
Published in IEEE transactions on information forensics and security (2020)

by Guin, Ujjwal, Zhou, Ziqi, Singh, Adit
Published in IEEE transactions on very large scale integration (VLSI) systems (01.05.2018)

by Guin, Ujjwal, DiMase, Daniel, Tehranipoor, Mohammad
Published in Journal of electronic testing (01.02.2014)

by Alam, Mahabubul, Chowdhury, Sreeja, Tehranipoor, Mark M., Guin, Ujjwal
Published in 2018 IEEE International Symposium on Hardware Oriented Security and Trust (HOST) (01.04.2018)

by He, Pengzhou, Guin, Ujjwal, Xie, Jiafeng
Published in IEEE journal on emerging and selected topics in circuits and systems (01.06.2021)

by Jain, Ayush, Zhou, Ziqi, Guin, Ujjwal
Published in 2021 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2021)

by Guin, Ujjwal, DiMase, Daniel, Tehranipoor, Mohammad
Published in Journal of electronic testing (01.02.2014)

by Wang, Wendong, Singh, Adit D., Guin, Ujjwal
Published in Journal of electronic testing (01.06.2022)

by Zhou, Ziqi, Guin, Ujjwal, Agrawal, Vishwani D.
Published in 2018 IEEE 36th VLSI Test Symposium (VTS) (01.04.2018)

by Tang, Chunli, Alahmed, Laith, Xu, Jihao, Shen, Maokang, Jones, Nicholas Alex, Sadi, Mehdi, Guin, Ujjwal, Zhao, Wenfeng, Li, Peng
Published in IEEE transactions on electron devices (01.04.2022)

by Collier, Zachary A., Guin, Ujjwal, Sarkis, Joseph, Lambert, James H.
Published in Benchmarking : an international journal (29.11.2022)