Life test result on 4 channel VCELs chip used in 28Gb/s data transfer in space application
Joly, S., Ouattara, M., Guibault, G., How, Lip Sun, Bechou, L., Gilard, O., Deshayes, Y.
Published in Microelectronics and reliability (01.11.2023)
Published in Microelectronics and reliability (01.11.2023)
Get full text
Journal Article