Development of device under test (DUT) board of LM741 op-amp IC for test development and measurement track of Mapua University
Latina, Mary Ann E., Baking, Dawn Howard L., Fernandez, Jed Emery S., Guevarra, Allen Davey R., Rastrullo, Raffy James R.
Published in 2017IEEE 9th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment and Management (HNICEM) (01.12.2017)
Published in 2017IEEE 9th International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment and Management (HNICEM) (01.12.2017)
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