Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements
Gao, Y., Guitard, N., Salamero, C., Bafleur, M., Bary, L., Escotte, L., Gueulle, P., Lescouzeres, L.
Published in Microelectronics and reliability (01.09.2007)
Published in Microelectronics and reliability (01.09.2007)
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