The right way to assess electronic system reliability: FIDES
Charpenel, P., Davenel, F., Digout, R., Giraudeau, M., Glade, M., Guerveno, JP, Guillet, N., Lauriac, A., Male, S., Manteigas, D., Meister, R., Moreau, E., Perie, D., Relmy-Madinska, F., Retailleau, P.
Published in Microelectronics and reliability (01.09.2003)
Published in Microelectronics and reliability (01.09.2003)
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