Microdose Induced Data Loss on Floating Gate Memories
Guertin, S.M., Nguyen, D.N., Patterson, J.D.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
SEL Induced Latent Damage, Testing, and Evaluation
Layton, P., Kniffin, S., Guertin, S., Swift, G., Buchner, S.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
Analysis of radiation effects on individual DRAM cells
Scheick, L.Z., Guertin, S.M., Swift, G.M.
Published in IEEE transactions on nuclear science (01.12.2000)
Published in IEEE transactions on nuclear science (01.12.2000)
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Journal Article
Radiation effects on advanced flash memories
Nguyen, D.N., Guertin, S.M., Swift, G.M., Johnston, A.H.
Published in IEEE transactions on nuclear science (01.12.1999)
Published in IEEE transactions on nuclear science (01.12.1999)
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Journal Article
Nitrogen fertilizer effect on breadmaking quality of hard red spring wheat in eastern Canada
Ayoub, M. (McGill Univ., Quebec, Canada), Guertin, S, Fregeau-Reid, J, Smith, D.L
Published in Crop science (01.09.1994)
Published in Crop science (01.09.1994)
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Journal Article
Single-event upset effects in optocouplers
Johnston, A.H., Swift, G.M., Miyahira, T., Guertin, S., Edmonds, L.D.
Published in IEEE transactions on nuclear science (01.12.1998)
Published in IEEE transactions on nuclear science (01.12.1998)
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Journal Article
Single-event upset in the PowerPC750 microprocessor
Swift, G.M., Fannanesh, F.F., Guertin, S.M., Irom, F., Millward, D.G.
Published in IEEE transactions on nuclear science (01.12.2001)
Published in IEEE transactions on nuclear science (01.12.2001)
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Journal Article
Aging and Shiftwork: The Effects of 20 Years of Rotating 12-Hour Shifts Among Petroleum Refinery Operators
BOURDOUXHE, M. A, QUEINNEC, Y, GRANGER, D, BARIL, R. H, GUERTIN, S. C, MASSICOTTE, P. R, LEVY, M, LEMAY, F. L
Published in Experimental aging research (01.10.1999)
Published in Experimental aging research (01.10.1999)
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Journal Article
Conference Proceeding
Ion-induced stuck bits in 1T/1C SDRAM cells
Edmonds, L.D., Guertin, S.M., Scheick, L.Z., Nguyen, D., Swift, G.M.
Published in IEEE transactions on nuclear science (01.12.2001)
Published in IEEE transactions on nuclear science (01.12.2001)
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Journal Article
A reliability evaluation methodology for memory chips for space applications when sample size is small
Chen, Y., Nguyen, D., Guertin, S., Bernstein, J., White, M., Menke, R., Kayali, S.
Published in IEEE International Integrated Reliability Workshop Final Report, 2003 (2003)
Published in IEEE International Integrated Reliability Workshop Final Report, 2003 (2003)
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Conference Proceeding
Phenylephrine advisory panel report
JONES, J, GREENBERG, L, GROUDINE, S, GUERTIN, S, HOFFMAN, R, HOLLINGER, I, MOKHIBER, L, ROSEN, M, RUBEN, R, SCHAFF, D
Published in International journal of pediatric otorhinolaryngology (15.09.1998)
Published in International journal of pediatric otorhinolaryngology (15.09.1998)
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Journal Article
Heavy Ion Bit Response and Analysis of 256 Megabit Non-Volatile Spin-Torque-Transfer Magnetoresistive Random Access Memory (STT-MRAM)
Katti, R. R., Guertin, S. M., Yang-Scharlotta, J. Y., Daniel, A. C., Some, R.
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
Published in 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018) (01.07.2018)
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Conference Proceeding