Layout dependency of PMOS off current degradation due to off-state stress
Jae Yong Seo, Hong Sik Park, Lee, S., Tae hun Kang, Gu Gwan Kang, Byung Heon Kwak, Won Shik Lee
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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Conference Proceeding
Time-to-Breakdown Behavior and Mechanism on U-grooved n-MOSFET
Seo, Jae Yong, Park, Hong Sik, Kang, Gu Gwan, Kang, Ju Seong, So, Byung Se
Published in ECS transactions (10.07.2009)
Published in ECS transactions (10.07.2009)
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Journal Article
Antifuse circuit of inverter type and method of programming the same
SEO JAE-YONG, KANG GU-GWAN, KANG TAE-HUN, KIM JUNG-HYEON, PARK HONG-SIK
Year of Publication 27.05.2010
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Year of Publication 27.05.2010
Patent
METHODE FOR MANAGING MULTI BURN-IN TEST
SEO, JAE YONG, KANG, GU GWAN, LEE, MIN KYEONG, KANG, TAE HUN, BAE, SUNG HOON, LEE, YOUNG YUN, PARK, HONG SIK
Year of Publication 07.01.2010
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Year of Publication 07.01.2010
Patent