by Ning, Meng-meng, Yang, Wen-ji, Guan, Wen-bo, Gu, Yi-pei, Feng, Ying, Leng, Ying
Published in Acta pharmacologica Sinica (01.11.2020)

by Sun, Bao-Ye, Gu, Pei-Yi, Guan, Ruo-Yu, Zhou, Cheng, Lu, Jian-Wei, Yang, Zhang-Fu, Pan, Chao, Zhou, Pei-Yun, Zhu, Ya-Ping, Li, Jia-Rui, Wang, Zhu-Tao, Gao, Shan-Shan, Gan, Wei, Yi, Yong, Luo, Ye, Qiu, Shuang-Jian
Published in World journal of surgical oncology (08.06.2022)

by Zhang, Lijie, Hsu, Yen-Ya, Chen, Frederick T, Lee, Heng-Yuan, Chen, Yu-Sheng, Chen, Wei-Su, Gu, Pei-Yi, Liu, Wen-Hsing, Wang, Shun-Min, Tsai, Chen-Han, Huang, Ru, Tsai, Ming-Jinn
Published in Nanotechnology (24.06.2011)

by Sun, Kai, Zhu, Nan-lin, Huang, Su-ling, Qu, Hui, Gu, Yi-pei, Qin, Li, Liu, Jia, Leng, Ying
Published in Acta pharmacologica Sinica (01.10.2024)

by Yang, Wen-ji, Han, Fang-hui, Gu, Yi-pei, Qu, Hui, Liu, Jia, Shen, Jian-hua, Leng, Ying
Published in Acta pharmacologica Sinica (01.08.2023)

by CHEN, Yu-Sheng, LEE, Heng-Yuan, CHEN, Frederick, TSAI, Ming-Jinn, KU, Tzu-Kun, CHEN, Pang-Shiu, CHEN, Wei-Su, TSAI, Kan-Hsueh, GU, Pei-Yi, WU, Tai-Yuan, TSAI, Chen-Han, RAHAMAN, S. Z, LIN, Yu-De
Published in IEEE electron device letters (01.02.2014)

by Chen, F. T., Heng-Yuan Lee, Yu-Sheng Chen, Rahaman, S. Z., Chen-Han Tsai, Kan-Hsueh Tsai, Tai-Yuan Wu, Wei-Su Chen, Pei-Yi Gu, Yu-De Lin, Shyh-Shyuan Sheu, Ming-Jinn Tsai, Li-Heng Lee, Tzu-Kun Ku, Pang-Shiu Chen
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)

by CHEN, Yu-Sheng, LEE, Heng-Yuan, TSAI, Ming-Jinn, LIEN, Chenhsin, CHEN, Pang-Shiu, LIU, Wen-Hsing, WANG, Sum-Min, GU, Pei-Yi, HSU, Yen-Ya, TSAI, Chen-Han, CHEN, Wei-Su, CHEN, Frederick
Published in IEEE electron device letters (01.11.2011)

by Shyh-Shyuan Sheu, Meng-Fan Chang, Ku-Feng Lin, Che-Wei Wu, Yu-Sheng Chen, Pi-Feng Chiu, Chia-Chen Kuo, Yih-Shan Yang, Pei-Chia Chiang, Wen-Pin Lin, Che-He Lin, Heng-Yuan Lee, Pei-Yi Gu, Sum-Min Wang, Chen, F T, Keng-Li Su, Chen-Hsin Lien, Kuo-Hsing Cheng, Hsin-Tun Wu, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai
Published in 2011 IEEE International Solid-State Circuits Conference (01.02.2011)

by CHEN, Yu-Sheng, LEE, Heng-Yuan, LIEN, Chenhsin, CHEN, Pang-Shiu, GU, Pei-Yi, LIU, Wen-Hsing, CHEN, Wei-Su, HSU, Yen-Ya, TSAI, Chen-Han, CHEN, Frederick, TSAI, Ming-Jinn
Published in IEEE electron device letters (01.03.2011)

by Chen, Pang-Shiu, Chen, Yu-Sheng, Lee, Heng-Yuan, Wu, Tai-Yuan, Tsai, Kan-Hsueh, Gu, Pei-Yi, Chen, Wei-Su, Tsai, Chen-Han, Chen, Frederick, Tsai, Ming-Jinn
Published in Microelectronic engineering (01.05.2013)

by Chen, Pang-Shiu, Chen, Yu-Sheng, Lee, Heng-Yuan, Liu, Wenshing, Gu, Pei-Yi, Chen, Frederick, Tsai, Ming-Jinn
Published in Solid-state electronics (01.11.2012)

by Yi Wu, Shimeng Yu, Wong, H.-S Philip, Yu-Sheng Chen, Heng-Yuan Lee, Sum-Min Wang, Pei-Yi Gu, Chen, F., Ming-Jinn Tsai
Published in 2012 4th IEEE International Memory Workshop (01.05.2012)

by Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Wei-Su Chen, Kan-Hsueh Tsai, Pei-Yi Gu, Tai-Yuan Wu, Chen-Han Tsai, Rahaman, S. Z., Yu-De Lin, Chen, Frederick, Ming-Jinn Tsai, Tzu-Kun Ku
Published in IEEE electron device letters (01.02.2014)

by Lee, Heng Yuan, Chen, Yu Sheng, Chen, Pang Shiu, Tsai, Chen Han, Gu, Pei Yi, Wu, Tai Yuan, Tsai, Kan Hseuh, Rahaman, Shakh Ziaur, Chen, Wei Su, Chen, Frederick, Tsai, Ming-Jing, Lee, Ming Hung, Ku, Tzu Kun
Published in Japanese Journal of Applied Physics (01.08.2014)

by Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Wen-Hsing Liu, Sum-Min Wang, Pei-Yi Gu, Yen-Ya Hsu, Chen-Han Tsai, Wei-Su Chen, Chen, F., Ming-Jinn Tsai, Chenhsin Lien
Published in IEEE electron device letters (01.11.2011)

by Yu-Sheng Chen, Heng-Yuan Lee, Pang-Shiu Chen, Pei-Yi Gu, Wen-Hsing Liu, Wei-Su Chen, Yen-Ya Hsu, Chen-Han Tsai, Chen, Frederick, Ming-Jinn Tsai, Chenhsin Lien
Published in IEEE electron device letters (01.03.2011)

by Rahaman, Sk Ziaur, Yu-De Lin, Pei-Yi Gu, Heng-Yuan Lee, Yu-Sheng Chen, Pan-Shiu Chen, Kan-Hsueh Tsai, Wei-Su Chen, Chien-Hua Hsu, Po-Tsung Tu, Chen, Frederick T., Ming-Jinn Tsai, Tzu-Kun Ku, Pei-Hua Wang
Published in 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2016)

by Lijie Zhang, Ru Huang, Yen-Ya Hsu, Chen, F T, Heng-Yuan Lee, Yu-Sheng Chen, Wei-Su Chen, Pei-Yi Gu, Wen-Hsing Liu, Shun-Min Wang, Chen-Han Tsai, Ming-Jinn Tsai, Pang-Shiu Chen
Published in 2011 International Reliability Physics Symposium (01.04.2011)

by Kan-Hsueh Tsai, Pang-Shiu Chen, Tai-Yuan Wu, Yu-Sheng Chen, Heng-Yuan Lee, Wei-Su Chen, Chen-Han Tsai, Pei-Yi Gu, Rahaman, S. Z., Yu-De Lin, Chen, F., Ming-Jinn Tsai, Tzu-Kun Ku
Published in 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) (01.04.2013)