Size dependence of TiN/HfO2/Ti MIM ReRAM resistance states: Model and experimental results
Chen, Frederick T., Lee, Heng-Yuan, Chen, Yu-Sheng, Chen, Pang-Shiu, Gu, Peggy, Chen, Chi-Wei, Hsu, Yen-Ya, Liu, Wen-Hsing, Chen, Wei-Su, Tsai, Ming-Jinn, Lo, Shen-Chuan, Lai, Ming-Wei
Published in Current applied physics (01.01.2010)
Published in Current applied physics (01.01.2010)
Get full text
Journal Article
Size dependence of TiN/HfO 2/Ti MIM ReRAM resistance states: Model and experimental results
Chen, Frederick T., Lee, Heng-Yuan, Chen, Yu-Sheng, Chen, Pang-Shiu, Gu, Peggy, Chen, Chi-Wei, Hsu, Yen-Ya, Liu, Wen-Hsing, Chen, Wei-Su, Tsai, Ming-Jinn, Lo, Shen-Chuan, Lai, Ming-Wei
Published in Current applied physics (2010)
Published in Current applied physics (2010)
Get full text
Journal Article