Electrostatic test structures for transmission line pulse and human body model testing at wafer level
Ashton, Robert, Fairbanks, Stephen, Bergen, Adam, Grund, Evan
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Published in 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) (01.03.2018)
Get full text
Conference Proceeding
Proper human body model testing of high voltage and "no connect" pins
Grund, Evan
Published in 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2017)
Published in 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2017)
Get full text
Conference Proceeding
High-Speed TLP and ESD Characterization of ICs
Muhonen, Kathleen, Grund, Evan, Ashton, Robert
Published in 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) (05.12.2021)
Published in 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) (05.12.2021)
Get full text
Conference Proceeding
Outstanding Contributions Award
Grund, Evan
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Get full text
Conference Proceeding
Empirical ESD simulation flow for ESD protection circuits based on snapback devices
Aharoni, Efraim, Parvin, Avi, Vaserman, Yosi, Grund, Evan
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)
Published in 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2016)
Get full text
Conference Proceeding
TLP systems with combined 50- and 500-Ω impedance probes and kelvin probes
GRUND, Evan, GAUTHIER, Robert
Published in IEEE transactions on electronics packaging manufacturing (01.07.2005)
Published in IEEE transactions on electronics packaging manufacturing (01.07.2005)
Get full text
Conference Proceeding
Journal Article
A New CDM Discharge Head for Increased Repeatability and Testing Small Pitch Packages
Grund, Evan, Chang, Thomas, Watkins, Roger, Burke, Chad, Katz, Justin, Gauthier, Robert
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
Published in 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2018)
Get full text
Conference Proceeding
Obtaining TLP-like information from an HBM simulator
Grund, Evan, Hernandez, Marcos
Published in 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2007)
Published in 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2007)
Get full text
Conference Proceeding