by Sheng, Xiaoqin, Kerkhoff, Hans, Zjajo, Amir, Gronthoud, Guido
Published in Journal of electronic testing (01.08.2012)

by Wang, Jing, H. Walker, D. M., Majhi, Ananta, Kruseman, Bram, Gronthoud, Guido, Villagra, Luis Elvira, van de Wiel, Paul, Eichenberger, Stefan
Published in 2006 IEEE International Test Conference (01.10.2006)

by Anders, Jens, Krishnan, Shaji, Gronthoud, Guido
Published in Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 16-20 Apr. 2007 (16.04.2007)

by Kruseman, B., Majhi, A.K., Gronthoud, G., Eichenberger, S.
Published in 2004 International Conferce on Test (2004)

by Xinyue Fan, Moore, W., Hora, C., Gronthoud, G.
Published in IEEE International Conference on Test, 2005 (2005)

by Kruseman, B., Majhi, A., Gronthoud, G.
Published in 25th IEEE VLSI Test Symposium (VTS'07) (01.05.2007)

by Zjajo, Amir, Pineda de Gyvez, Jose, Gronthoud, Guido
Published in Journal of electronic testing (01.12.2006)

by Xinyue Fan, Moore, W., Hora, C., Konijnenburg, M., Gronthoud, G.
Published in 24th IEEE VLSI Test Symposium (2006)

by Baker, K., Gronthoud, G., Lousberg, M., Schanstra, I., Hawkins, C.
Published in International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034) (1999)

by Anders, J., Krishnan, S., Gronthoud, G.
Published in 2007 Design, Automation & Test in Europe Conference & Exhibition (01.04.2007)

by Silva, E., Pineda de Gyvez, J., Gronthoud, G.
Published in IEEE International Conference on Test, 2005 (2005)

by Pineda de Gyvez, J., Gronthoud, G., Amine, R.
Published in International Test Conference, 2003. Proceedings. ITC 2003 (2003)

by de Gyvez, José Pineda, Gronthoud, Guido, Amine, Rachid
Published in Journal of electronic testing (01.06.2005)

by Majhi, Ananta K., Azimane, Mohamed, Gronthoud, Guido, Lousberg, Maurice, Eichenberger, Stefan, Bowen, Fred
Published in Design, Automation and Test in Europe (07.03.2005)

by Moore, W., Gronthoud, G., Baker, K., Lousberg, M.
Published in Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) (2000)

by Azimane, M., Majhi, A., Gronthoud, G., Lousberg, M., Eichenberger, S., Ruiz, A.L.
Published in 23rd IEEE VLSI Test Symposium (VTS'05) (2005)

by Majhi, A., Mohamed Azimane, Gronthoud, G., Lousberg, M., Eichenberger, S., Bowen, F.
Published in Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005 (2005)

by Xiaoqin Sheng, Kerkhoff, H., Zjajo, A., Gronthoud, G.
Published in 2009 14th IEEE European Test Symposium (01.05.2009)

by Pineda de Gyvez, J., Gronthoud, G., Cenci, C., Posch, M., Burger, T., Koller, M.
Published in 2004 International Conferce on Test (2004)

by Zivkovic, Vladimir A., van der Heyden, Frank, Gronthoud, Guido, de Jong, Frans
Published in 2008 13th European Test Symposium (01.05.2008)