Surface analysis of Nb materials for SRF cavities
Maheshwari, P., Tian, H., Reece, C. E., Kelley, M. J., Myneni, G. R., Stevie, F. A., Rigsbee, J. M., Batchelor, A. D., Griffis, D. P.
Published in Surface and interface analysis (01.01.2011)
Published in Surface and interface analysis (01.01.2011)
Get full text
Journal Article
Conference Proceeding
Etching characteristics of chromium thin films by an electron beam induced surface reaction
Wang, Jianhua, Griffis, D P, Garcia, R, Russell, P E
Published in Semiconductor science and technology (01.04.2003)
Published in Semiconductor science and technology (01.04.2003)
Get full text
Journal Article
SIMS analysis of zinc oxide LED structures: quantification and analysis issues
Stevie, F. A., Maheshwari, P., Pierce, J. M., Adekore, B. T., Griffis, D. P.
Published in Surface and interface analysis (01.01.2013)
Published in Surface and interface analysis (01.01.2013)
Get full text
Journal Article
Conference Proceeding
SIMS analysis of high-performance accelerator niobium
Maheshwari, P., Stevie, F. A., Myneni, G. R., Ciovati, G., Rigsbee, J. M., Dhakal, P., Griffis, D. P.
Published in Surface and interface analysis (01.11.2014)
Published in Surface and interface analysis (01.11.2014)
Get full text
Journal Article
Circuit editing of copper and low‐k dielectrics in nanotechnology devices
MOSSELVELD, F., MAKAROV, V. V., LUNDQUIST, T. R., GRIFFIS, D. P., RUSSELL, P. E.
Published in Journal of microscopy (Oxford) (01.06.2004)
Published in Journal of microscopy (Oxford) (01.06.2004)
Get full text
Journal Article
Focused Ion Beam Characterization of Bicomponent Polymer Fibers
Wong, K.C., Haslauer, C.M., Anantharamaiah, N., Pourdeyhimi, B., Batchelor, A.D., Griffis, D.P.
Published in Microscopy and microanalysis (01.06.2010)
Published in Microscopy and microanalysis (01.06.2010)
Get full text
Journal Article
SIMS quantification of matrix and impurity species in AlxGa1-xN
GU, C. J, STEVIE, F. A, HITZMAN, C. J, SARIPALLI, Y. N, JOHNSON, M, GRIFFIS, D. P
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
Get full text
Conference Proceeding
Journal Article
Back side SIMS analysis of hafnium silicate
Gu, C., Stevie, F.A., Bennett, J., Garcia, R., Griffis, D.P.
Published in Applied surface science (30.07.2006)
Published in Applied surface science (30.07.2006)
Get full text
Journal Article
Conference Proceeding
Discrimination between adsorption and coprecipitation in aquatic particle standards by surface analysis techniques: lead distributions in calcium carbonates
Fulghum, Julia E, Bryan, Scott R, Linton, Richard W, Bauer, Christopher F, Griffis, Dieter P
Published in Environmental science & technology (01.04.1988)
Published in Environmental science & technology (01.04.1988)
Get full text
Journal Article
Effects of Beam and Scan Parameters on 3-Dimensional Carbon Structure Growth Using Electron Beam Induced Chemistry
Garetto, AD, Garcia, R, Griffis, DP, Russell, PE
Published in Microscopy and microanalysis (01.08.2006)
Published in Microscopy and microanalysis (01.08.2006)
Get full text
Journal Article
Dose-dependent cesium ion beam damage effects on chemically modified poly(methyl methacrylate) films using secondary ion mass spectrometry and x-ray photoelectron spectroscopy
Simko, S. J, Griffis, D. P, Murray, R. W, Linton, R. W
Published in Analytical chemistry (Washington) (01.01.1985)
Published in Analytical chemistry (Washington) (01.01.1985)
Get full text
Journal Article
Focused Ion Beam: Much More Than a Sample Preparation Tool
Russell, P.E., Stark, T.J., Viterelli, J.P., Guichard, A.R., Wang, J., Bunker, K. L., Gonzalez, J.C., Griffis, D.P.
Published in Microscopy and microanalysis (01.08.2002)
Published in Microscopy and microanalysis (01.08.2002)
Get full text
Journal Article
Correlative light, electron, and ion microscopy on a single histologic section
Kupke, K G, Pickett, J P, Ingram, P, Griffis, D P, Linton, R W, Shelburne, J D
Published in Journal of microscopy (Oxford) (01.07.1983)
Published in Journal of microscopy (Oxford) (01.07.1983)
Get more information
Journal Article
Acceptor and donor doping of AlxGa1−xN thin film alloys grown on 6H-SiC(0001) substrates via metalorganic vapor phase epitaxy
Bremser, M. D., Perry, W. G., Nam, O. H., Griffis, D. P., Loesing, R., Ricks, D. A., Davis, R. F.
Published in Journal of electronic materials (01.04.1998)
Published in Journal of electronic materials (01.04.1998)
Get full text
Journal Article
Dopant redistribution during thermal oxidation of monocrystalline beta-SiC thin films
PALMOUR, J. W, DAVIS, R. F, KONG, H. S, CORCORAN, S. F, GRIFFIS, D. P
Published in Journal of the Electrochemical Society (01.02.1989)
Published in Journal of the Electrochemical Society (01.02.1989)
Get full text
Journal Article