Quantitative characterization of the interface roughness of (GaIn)As quantum wells by high resolution STEM
Han, H., Beyer, A., Jandieri, K., Gries, K.I., Duschek, L., Stolz, W., Volz, K.
Published in Micron (Oxford, England : 1993) (01.12.2015)
Published in Micron (Oxford, England : 1993) (01.12.2015)
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