SiGe heterojunction bipolar transistors and circuits toward terahertz communication applications
Jae-Sung Rieh, Jagannathan, B., Greenberg, D.R., Meghelli, M., Rylyakov, A., Guarin, F., Zhijian Yang, Ahlgren, D.C., Freeman, G., Cottrell, P., Harame, D.
Published in IEEE transactions on microwave theory and techniques (01.10.2004)
Published in IEEE transactions on microwave theory and techniques (01.10.2004)
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Journal Article
Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length
Randa, James, Sweeney, Susan L., McKay, Tom, Walker, David K., Greenberg, David R, Tao, Jon, Mendez, Judah, Rezvani, G. Ali, Pekarik, John J.
Published in 2005 66th ARFTG Microwave Measurement Conference (ARFTG) (01.12.2005)
Published in 2005 66th ARFTG Microwave Measurement Conference (ARFTG) (01.12.2005)
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Conference Proceeding
Foundation of rf CMOS and SiGe BiCMOS technologies
Dunn, James S, Ahlgren, David C, Coolbaugh, Douglas D, Feilchenfeld, Natalie B
Published in IBM journal of research and development (01.03.2003)
Published in IBM journal of research and development (01.03.2003)
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Journal Article
Reverse noise measurement and use in device characterization
Randa, J., McKay, T., Sweeney, S.L., Walker, D.K., Wagner, L., Greenberg, D.R., Tao, J., Ali Rezvani, G.
Published in IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 (2006)
Published in IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 (2006)
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Conference Proceeding
Fundamental Power and Frequency Limits of Deeply-Scaled CMOS for RF Power Applications
Scholvin, J., Greenberg, D.R., del Alamo, J.A.
Published in 2006 International Electron Devices Meeting (01.12.2006)
Published in 2006 International Electron Devices Meeting (01.12.2006)
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Conference Proceeding