Direct observation of defect-mediated cluster nucleation
Kaiser, U, Muller, D.A, Grazul, J.L, Chuvilin, A, Kawasaki, M
Published in Nature materials (01.10.2002)
Published in Nature materials (01.10.2002)
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Journal Article
High-mobility electrons in SrTiO3 heterostructures
Hwang, H.Y., Ohtomo, A., Nakagawa, N., Muller, D.A., Grazul, J.L.
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2004)
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2004)
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Journal Article
Atomic-scale imaging of nanoengineered oxygen vacancy profiles in SrTiO3
MULLER, David A, NAKAGAWA, Naoyuki, OHTOME, Aklra, GRAZUL, John L, HWANG, Harold Y
Published in Nature (London) (05.08.2004)
Published in Nature (London) (05.08.2004)
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Journal Article
Atomic-scale imaging of individual dopant atoms and clusters in highly n -type bulk Si
Muller, D. A, Voyles, P. M, Grazul, J. L, Citrin, P. H, Gossmann, H.-J. L
Published in Nature (London) (25.04.2002)
Published in Nature (London) (25.04.2002)
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Journal Article
Imaging individual atoms inside crystals with ADF-STEM
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Journal Article
Conference Proceeding
High-mobility electrons in SrTiO 3 heterostructures
Hwang, H.Y., Ohtomo, A., Nakagawa, N., Muller, D.A., Grazul, J.L.
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2004)
Published in Physica. E, Low-dimensional systems & nanostructures (01.04.2004)
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Journal Article
A novel, aerosol-nanocrystal floating-gate device for non-volatile memory applications
De Blauwe, J., Ostraat, M., Green, M.L., Weber, G., Sorsch, T., Kerber, A., Klemens, F., Cirelli, R., Ferry, E., Grazul, J.L., Baumann, F., Kim, Y., Mansfield, W., Bude, J., Lee, J.T.C., Hillenius, S.J., Flagan, R.C., Atwater, H.A.
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
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Conference Proceeding
50 nm Vertical Replacement-Gate (VRG) pMOSFETs
Sang-Hyun Oh, Hergenrother, J.M., Nigam, T., Monroe, D., Klemens, F.P., Kornblit, A., Mansfield, W.M., Baker, M.R., Barr, D.L., Baumann, F.H., Bolan, K.J., Boone, T., Ciampa, N.A., Cirelli, R.A., Eaglesham, D.J., Ferry, E.J., Fiory, A.T., Frackoviak, J., Garno, J.P., Gossmann, H.J., Grazul, J.L., Green, M.L., Hillenius, S.J., Johnson, R.W., Keller, R.C., King, C.A., Kleiman, R.N., Lee, J.T.-C., Miner, J.F., Morris, M.D., Rafferty, C.S., Rosamilia, J.M., Short, K., Sorsch, T.W., Timko, A.G., Weber, G.R., Wilk, G.D., Plummer, J.D.
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
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Conference Proceeding
SALVO process for sub-50 nm low-V/sub T/ replacement gate CMOS with KrF lithography
Chang, C.-P., Vuang, H.-H., Baker, M.R., Pai, C.S., Klemens, F.P., Miner, J.F., Mansfield, W.M., Kleiman, R.N., Kornbllit, A., Baumann, F.H., Rogers, S.N., Bude, M., Grazul, J.L., Lloyd, E.J., Frei, M., Sorsch, T.W., Cirelli, R., Ferry, E., Bolan, K., Barr, D., Lee, J.T.-C.
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
Published in International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) (2000)
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Conference Proceeding
50 nm vertical replacement-gate (VRG) nMOSFETs with ALD HfO/sub 2/ and Al/sub 2/O/sub 3/ gate dielectrics
Hergenrother, J.M., Wilk, G.D., Nigam, T., Klemens, F.P., Monroe, D., Silverman, P.J., Sorsch, T.W., Busch, B., Green, M.L., Baker, M.R., Boone, T., Bude, M.K., Ciampa, N.A., Ferry, E.J., Fiory, A.T., Hillenius, S.J., Jacobson, D.C., Johnson, R.W., Kalavade, P., Keller, R.C., King, C.A., Kornblit, A., Krautter, H.W., Lee, J.T.-C., Mansfield, W.M., Miner, J.F., Morris, M.D., Oh, S.-H., Rosamilia, J.M., Sapjeta, B.J., Short, K., Steiner, K., Muller, D.A., Voyles, P.M., Grazul, J.L., Shero, E.J., Givens, M.E., Pomarede, C., Mazanec, M., Werkhoven, C.
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
Published in International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) (2001)
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Conference Proceeding