Gate dielectric integrity and reliability in 0.5- mu m CMOS technology
Strong, A.W., Stamper, A.K., Bolam, R.J., Furukawa, T., Gow, C.J., Gow, T.R., Martin, D.W., Mittl, S.W., Nakos, J.S., Pennington, S.L.
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
Published in 31st Annual Proceedings Reliability Physics 1993 (1993)
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