A new approach to extract the threshold voltage of MOSFETs
Ortiz-Conde, A., Gouveia Fernandes, E.D., Liou, J., Rofiqul Hassan, M., Garcia-Sanchez, F.J., de Mercato, G., Waisum Wong
Published in IEEE transactions on electron devices (01.09.1997)
Published in IEEE transactions on electron devices (01.09.1997)
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