by Rink, Sven, Kammerer, Jean-Baptiste, Quenette, Vincent, Uhring, Wilfried, Gouget, Gilles, Manouvrier, Jean-Robert, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2024)

by Garegnani, Giacomo, Fiori, Vincent, Gouget, Gilles, Monsieur, Frederic, Tavernier, Clement
Published in Microelectronics and reliability (01.08.2016)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, André, Gouget, Gilles, Ghibaudo, Gérard
Published in Solid-state electronics (01.07.2018)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, André, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Pradeep, Krishna, Gouget, Gilles, Poiroux, Thierry, Scheer, Patrick, Juge, Andre, Ghibaudo, Gerard
Published in 2017 International Conference of Microelectronic Test Structures (ICMTS) (01.03.2017)

by Rideau, D., Uhring, W., Bianchi, R. A., Helleboid, R., Mugny, G., Grebot, J., Manouvrier, J.R., Neri, R., Brun, F., Lakeh, M. Dolatpoor, Rink, S., Kammerer, J-B., Lallement, C., Lacombe, E., Golanski, D., Rae, B., Bah, T. M., Twaddle, F., Quenette, V., Marchand, G., Buj, C., Fillon, R., Henrion, Y., Nicholson, I., Agnew, M., Basset, M., Perrier, R., Al-Rawhani, M., Mamdy, B., Pellegrin, S., Gouget, G., Maciazek, P., Juge, A., Dartigues, A., Alause, H. Wehbe
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Juge, Andre, Gouget, Gilles, Ghibaudo, Gerard
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)

by Pradeep, Krishna, Poiroux, Thierry, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Ghibaudo, Gerard
Published in 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (01.04.2017)

by Guegan, Georges, Pretet, Jeremy, Gwoziecki, Romain, Gonnard, Olivier, Gouget, Gilles, Touret, Patricia, Raynaud, Christine, Deleonibus, Simon
Published in ECS transactions (27.04.2007)

by Guegan, Georges, Pretet, Jeremy, Gwoziecki, Romain, Gonnard, Olivier, Gouget, Gilles, Touret, Patricia, Raynaud, Christine, Deleonibus, Simon
Published in Meeting abstracts (Electrochemical Society) (01.03.2007)

by Raynaud, Christine, Gianesello, Frederic, Tinella, Carlo, Flatresse, Philippe, Gwoziecki, Romain, Touret, Patricia, Avenier, Gregory, Haendler, Sebastien, Gonnard, Olivier, Gouget, Gilles, Labourey, Guillaume, Pretet, Jeremy, Marin, Mathieu, Schwartzmann, Thierry, Di FRENZA, Regis, Axelrad, David, Delatte, Pierre, Provins, Gerald, Roux, Jocelyn, Balossier, Eric, Vildeuil, Jean-Charles, Boret, Samuel, Van Haaren, Bart, Chevalier, Pascal, Boissonnet, Laurence, Chantre, Alain, Gloria, Daniel, Scheer, Patrick, Pavageau, Christophe, Dambrine, Gilles
Published in Meeting abstracts (Electrochemical Society) (22.02.2006)