Search Results - "Goudet, Esther" :: K.UTB vyhledávací portál

Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

by Goudet, Esther, Sureau, Fabio, Breuil, Paul, Peña Treviño, Luis, Naviner, Lirida, Daveau, Jean-Marc, Roche, Philippe
Published in Journal of electronic testing (01.06.2024)

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Journal Article

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Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning

by Goudet, Esther, Trevino, Luis H. Pena, Dos Santos, Gutemberg Goncalves, El Hajji, Sayah, Sureau, Fabio, Naviner, Lirida, Daveau, Jean-Marc, Roche, Philippe
Published in 2024 37th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design (SBCCI) (02.09.2024)

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Conference Proceeding

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Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning

by Goudet, Esther, Trevino, Luis Pena, Naviner, Lirida, Daveau, Jean-Marc, Roche, Philippe
Published in 2023 IEEE 24th Latin American Test Symposium (LATS) (21.03.2023)

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Conference Proceeding

Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach

Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning

Fast analysis of combinatorial netlists correctness rate based on binomial law and partitioning

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