Wavelet-based information theory in quantitative assessment of AFM images’ quality
Pruchnik, Bartosz Czesław, Putek, Piotr Adam, Gotszalk, Teodor Paweł
Published in Scientific reports (18.02.2024)
Published in Scientific reports (18.02.2024)
Get full text
Journal Article
Structural properties of bulk GaN substrates: Impact of structural anisotropy on non‐polar and semi‐polar crystals
Serafińczuk, Jarosław, Kucharski, Robert, Zając, Marcin, Gotszalk, Teodor Paweł, Kudrawiec, Robert
Published in Crystal research and technology (1979) (01.11.2015)
Published in Crystal research and technology (1979) (01.11.2015)
Get full text
Journal Article
Fourier analysis of scratches generated on m-GaN substrates during polishing
Serafińczuk, Jarosław, Jóźwiak, Grzegorz, Pałetko, Piotr, Kudrawiec, Robert, Kucharski, Robert, Zajac, Marcin, Gotszalk, Teodor Paweł
Published in Crystal research and technology (1979) (01.03.2015)
Published in Crystal research and technology (1979) (01.03.2015)
Get full text
Journal Article
Atomic force microscopy of partially polished and epi-ready c-plane GaN substrates obtained by an ammonothermal method
Serafinczuk, Jaros aw, Jó wiak, Grzegorz, Pa etko, Piotr, Kudrawiec, Robert, Kucharski, Robert, Zajac, Marcin, Gotszalk, Teodor Pawe
Published in Applied physics express (01.05.2014)
Published in Applied physics express (01.05.2014)
Get full text
Journal Article
Diagnostics of micro- and nanostructure using the scanning probe microscopy
Teodor Paweł Gotszalk, Paweł Janus, Andrzej Marek Marendziak, Piotr Czarnecki, Jacek Mikołaj Radojewski, Roman F. Szeloch, Piotr B. Grabiec, Ivo W. Rangelow
Published in Journal of Telecommunications and Information Technology (30.03.2005)
Published in Journal of Telecommunications and Information Technology (30.03.2005)
Get full text
Journal Article