Analysis of microdefects in a silicon single crystal by diffuse X-ray scattering using synchrotron radiation
Kim, Hante, Gotoh, Shun Ji, Takahashi, Toshio, Ishikawa, Tetsuya, Kikuta, Seishi
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.05.1986)
Published in Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment (15.05.1986)
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Journal Article
APPARATUS FOR WEFT METERING AND RETAINING IN SHUTTLELESS WEAVING LOOMS
UMEZAWA HIDETUGU,JP, NAKAO MASASHI,JP, TANAKA SHIGENORI,JP, GOTOH MIYUKI,JP
Year of Publication 16.04.1984
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Year of Publication 16.04.1984
Patent