Concurrent tDCS and Mirror Feedback has additive effects on M1 excitability
Chen, Ge “Paul”, Yarossi, Mathew, Gordon, Seth, Gomes, Kayla, Rubakhina, Anna, Adamovich, Sergei, Tunik, Eugene
Published in Brain stimulation (01.07.2017)
Published in Brain stimulation (01.07.2017)
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Journal Article
Effect of Aging on Component Reliability in Harsh Thermal Cycling
Akkara, Francy John, Zhao, Cong, Gordon, Seth, Su, Sinan, Abueed, Mohammed, Hamasha, Sa'd, Suhling, Jeff, Lall, Pradeep
Published in 2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2019)
Published in 2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2019)
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Conference Proceeding
Reliability Comparisons of FPBGA Assemblies Under Hot/Cold Biased Thermal Cycle
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Trade Publication Article
A population-based study in Ghana to investigate inter-individual variation in plasma t-PA and PAI-1
Williams, Scott M, Stocki, Shelli, Jiang, Lan, Brew, Kwabena, Gordon, Seth, Vaughan, Douglas E, Brown, Nancy J, Poku, Kwabena A, Moore, Jason H
Published in Ethnicity & disease (01.06.2007)
Published in Ethnicity & disease (01.06.2007)
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Journal Article
Voronoi residuals and other residual analyses applied to CSEP earthquake forecasts
Gordon, Joshua Seth, Clements, Robert Alan, Schoenberg, Frederic Paik, Schorlemmer, Danijel
Published in Spatial statistics (01.11.2015)
Published in Spatial statistics (01.11.2015)
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Journal Article
For the patient. Understanding how blood clotting may be linked to genetics
Published in Ethnicity & disease
(01.06.2007)
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Journal Article
Reliability of Micro-Alloyed SnAgCu Based Solder Interconnections for Various Harsh Applications
Su, Sinan, John Akkara, Francy, Raj, Anto, Zhao, Cong, Gordon, Seth, Sridhar, Sharath, Thirugnanasambandam, Sivasubramanian, Hamasha, Sa'd, Suhling, Jeffery, Evans, John
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01.05.2019)
Published in 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) (01.05.2019)
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Conference Proceeding
Degradation of Leadfree Solder Materials Subjected to Isothermal Aging with Use of the CABGA208 Package
Gordon, Seth, Sanders, Thomas, Raj, Anto, Evans, Christy J., Devall, Tom, Harris, Gregory, Evans, John L.
Published in 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2020)
Published in 2020 Pan Pacific Microelectronics Symposium (Pan Pacific) (01.02.2020)
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Conference Proceeding
Drop impact reliability testing of isothermally aged doped low creep lead-free solder paste alloys
Sridhar, Sharath, Raj, Anto, Gordon, Seth, Thirugnanasambandam, Sivasubramanian, Evans, John L., Johnson, Wayne
Published in 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2016)
Published in 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2016)
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Conference Proceeding
Proportional Hazard Model of doped low creep lead free solder paste under thermal shock
Raj, Anto, Thirugnanasambandam, Sivasubramanian, Sanders, Thomas, Sridhar, Sharath, Gordon, Seth, Evans, John, Megahed, Fadel, Bozack, Michael, Johnson, Wayne, Carpenter, Mark
Published in 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2016)
Published in 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2016)
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Conference Proceeding
Proportional Hazard Model of doped low creep lead free solder paste under vibration
Thirugnanasambandam, Sivasubramanian, Raj, Anto, Stone, Derrick, Sanders, Thomas, Sridhar, Sharath, Gordon, Seth, Evans, John, Megahed, Fadel, Flowers, George, Bozack, Michael, Johnson, Wayne, Carpenter, Mark
Published in 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2016)
Published in 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) (01.05.2016)
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Conference Proceeding
Visual diagnosis: two infants who have coarse facial features and growth and developmental delay
Beltroy, Eduardo, Umpaichitra, Vatcharapan, Gordon, Seth, Castells, Salvado, O'Connor, Kristine, Gomez, Ricardo, Knoebel, Erin
Published in Pediatrics in review (01.01.2003)
Published in Pediatrics in review (01.01.2003)
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Journal Article