Surrogate-Based Modeling Techniques for Mapping Transistor Figures of Merit onto Compact Model Parameters
Velarde Gonzalez, Fabio A., Chavez-Hurtado, Jose L., Lange, Andre, Mikolajick, Thomas
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
Published in 2022 IEEE International Integrated Reliability Workshop (IIRW) (09.10.2022)
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Conference Proceeding
Supporting analog design for reliability by efficient provision of reliability information to designers
Velarde Gonzalez, Fabio A., Hahne, Lukas, Ortstein, Katrin, Lange, Andre, Crocoll, Sonja
Published in 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (03.05.2023)
Published in 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (03.05.2023)
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Conference Proceeding
RF small-signal modeling of HCI degradation in FDSOI NMOSFET using BSIM-IMG
Velarde Gonzalez, Fabio A., Lange, Andre, Chohan, Talha, Mikolajick, Thomas
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
Published in 2021 IEEE International Integrated Reliability Workshop (IIRW) (04.10.2021)
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Conference Proceeding
On the Interpolation from Transistor Figures of Merit to Compact Model Parameters
Hahne, Lukas, Wagner, Jakob, Gonzalez, Fabio A. Velarde, Giering, Kay-Uwe, Lange, André
Published in IFAC-PapersOnLine (01.01.2022)
Published in IFAC-PapersOnLine (01.01.2022)
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Journal Article
A general approach for degradation modeling to enable a widespread use of aging simulations in IC design
Lange, André, Gonzalez, Fabio A. Velarde, Giering, Kay-Uwe, Vervantidis, Anastasios, Hahne, Lukas, Heinig, Andy, Jancke, Roland
Published in Microelectronics and reliability (01.10.2022)
Published in Microelectronics and reliability (01.10.2022)
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Journal Article
Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits
Lange, Andre, Gonzalez, Fabio A. Velarde, Lahbib, Insaf, Crocoll, Sonja
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
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Conference Proceeding