Search Results - "Gong, Hyun-Woo" :: K.UTB vyhledávací portál

Degradation Mechanism of Si Anode in Sulfide-based All-Solid-State Batteries Revealed by Observation of SEI Layer Using 4D-STEM/Super-EDS

by Cho, Hyeyoung, Kang, Sangjun, Tag, Kyong-Ryol, Cho, Hyelin, Gong, Hyun-Woo, Kim, Hong-Kyu, Kim, Hae-Ryoung, Ahn, Jae-Pyoung
Published in Microscopy and microanalysis (22.07.2023)

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Journal Article

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X X A SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION ANALYSIS METHOD USING THE SAME

by KIM YUN SUNG, LEE SANG HEON, KIM HAE RYOUNG, GONG HYUN WOO, IM GA HYEON, AHN JAE PYOUNG, LEE BYEONG HYEON, LEE KYU JOON, LEE YOON KWANG
Year of Publication 14.02.2024

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Patent

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SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION ANALYSIS METHOD USING THE SAME

by Lee, Sang Heon, Lee, Byeong Hyeon, Kim, Yun Sung, Im, Ga Hyeon, Gong, Hyun Woo, Kim, Hae Ryoung, Lee, Kyu Joon, Ahn, Jae Pyoung, Lee, Yoon Kwang
Year of Publication 08.02.2024

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Patent

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TAPE TENSION MAINTAINING APPARATUS OF WAFER MOUNTING SYSTEM USED FOR SEMICONDUCTOR PACKAGE

by GONG, WOO-HYUN
Year of Publication 15.07.1999

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Patent

Degradation Mechanism of Si Anode in Sulfide-based All-Solid-State Batteries Revealed by Observation of SEI Layer Using 4D-STEM/Super-EDS

X X A SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION ANALYSIS METHOD USING THE SAME

SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION ANALYSIS METHOD USING THE SAME

TAPE TENSION MAINTAINING APPARATUS OF WAFER MOUNTING SYSTEM USED FOR SEMICONDUCTOR PACKAGE

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