The effect of gate overlap lightly doped drains on low temperature poly-Si thin film transistors
Cho, Jaehyun, Jung, Sungwook, Jang, Kyungsoo, Park, Hyungsik, Heo, Jongkyu, Lee, Wonbaek, Gong, DaeYoung, Park, Seungman, Choi, Hyungwook, Jung, Hanwook, Choi, Byoungdeog, Yi, Junsin
Published in Microelectronics and reliability (2012)
Published in Microelectronics and reliability (2012)
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SiO[sub 2] Films Deposited by APCVD with a TEOS/Ozone Mixture and Its Application to the Gate Dielectric of TFTs
Kim, Jaehong, Jung, Sungwook, Jang, Kyungsoo, Park, Hyungsik, Cho, Jaehyun, Lee, Wonbaek, Gong, Daeyoung, Choi, Byoungdeog, Kim, Youngkuk, Park, Jinju, Kim, Kwangyeol, Yi, Junsin
Published in Journal of the Electrochemical Society (2010)
Published in Journal of the Electrochemical Society (2010)
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