Electrical and materials properties of AlN/ HfO2 high-k stack with a metal gate
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Published in Thin solid films (27.02.2009)
Published in Thin solid films (27.02.2009)
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Atomic force microscope study of three-dimensional nanostructure sidewalls
Hussain, Muhammad Mustafa, Gondran, Carolyn F H, Michelson, Diane K
Published in Nanotechnology (22.08.2007)
Published in Nanotechnology (22.08.2007)
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