SiGe wires and dots grown by local epitaxy
Brunner, J., Schittenhelm, P., Gondermann, J., Spangenberg, B., Hadam, B., Köster, T., Roskos, H.G., Kurz, H., Gossner, H., Eisele, I., Abstreiter, G.
Published in Journal of crystal growth (01.05.1995)
Published in Journal of crystal growth (01.05.1995)
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Journal Article
Conference Proceeding
New concept for ultra small N-MOSFET's
Gondermann, J., Schiepanski, J., Hadam, B., Köster, T., Röwer, T., Stein, J., Spangenberg, B., Roskos, H., Kurz, H.
Published in Microelectronic engineering (01.02.1997)
Published in Microelectronic engineering (01.02.1997)
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Journal Article
MOS-compatible fabrication and characterization of tunnel junctions in BESOI-material
Köster, T., Hadam, B., Goldschmidtböing, F., Hofmann, K., Gondermann, J., Stein, J., Hu, S., Altmeyer, S., Spangenberg, B., Kurz, H.
Published in Microelectronic engineering (1998)
Published in Microelectronic engineering (1998)
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Journal Article
Conference Proceeding
Fabrication and characterisation of SiGe based in-plane-gate transistors
Köster, T., Stein, J., Hadam, B., Gondermann, J., Spangenberg, B., Roskos, H.G., Kurz, H., Holzmann, M., Riedinger, M., Abstreiter, G.
Published in Microelectronic engineering (01.02.1997)
Published in Microelectronic engineering (01.02.1997)
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Journal Article
Investigation of Si/SiGe heterostructures patterned by reactive ion etching
KÖSTER, T, HADAM, B, GONDERMANN, J, SPANGENBERG, B, ROSKOS, H. G, KURZ, H, BRUNNER, J, ABSTREITER, G
Published in Microelectronic engineering (1996)
Published in Microelectronic engineering (1996)
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Conference Proceeding
Fabrication and characterization of Si/SiGe nanometer structures
Gondermann, J., Spangenberg, B., Ko¨ster, T., Hadam, B., Roskos, H.G., Kurz, H., Brunner, J., Schittenhelm, P., Abstreiter, G., Goßner, H., Eisele, I.
Published in Microelectronic engineering (01.02.1995)
Published in Microelectronic engineering (01.02.1995)
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Journal Article
Conference Proceeding
Investigation of [formula omitted] heterostructures patterned by reactive ion etching
Köster, T., Hadam, B., Gondermann, J., Spangenberg, B., Roskos, H.G., Kurz, H., Brunner, J., Abstreiter, G.
Published in Microelectronic engineering (01.01.1996)
Published in Microelectronic engineering (01.01.1996)
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Journal Article
Al-SiO(2)-Al sandwich microstrip lines for high-frequency on-chip interconnects
Gondermann, J, von Kamienski, E G S, Roskos, H G, Kurz, H
Published in IEEE transactions on microwave theory and techniques (01.12.1993)
Published in IEEE transactions on microwave theory and techniques (01.12.1993)
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Journal Article
Al-SiO2-Al sandwich microstrip lines for high-frequency on-chip interconnects
GONDERMANN, J, VON KAMIENSKI, E. G. S, ROSKOS, H. G, KURZ, H
Published in IEEE transactions on microwave theory and techniques (01.12.1993)
Published in IEEE transactions on microwave theory and techniques (01.12.1993)
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Journal Article