Determination of the Junction Temperature Under Load Current in GaN Power Devices with Schottky Gate Leakage Current as TSEP
Goller, Maximilian, Franke, Jorg, Lentzsch, Tobias, Lutz, Josef, Basler, Thomas, Mouhoubi, Samir, Curatola, Gilberto
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
Published in 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) (02.06.2024)
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Conference Proceeding
Temperature Distribution of an IGBT Chip during Repetitive Switching Events under Consideration of Front-Side Ageing
Baumler, Christian, Zhang, Bo, Goller, Maximilian, Liu, Xing, Basler, Thomas
Published in 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) (05.09.2022)
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Published in 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe) (05.09.2022)
Conference Proceeding