The dependence of UMOSFET characteristics and reliability on geometry and processing
Suliman, S A, Gollagunta, N, Trabzon, L, Hao, J, Ridley, R S, Knoedler, C M, Dolny, G M, Awadelkarim, O O, Fonash, S J
Published in Semiconductor science and technology (01.06.2001)
Published in Semiconductor science and technology (01.06.2001)
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Journal Article
Characterization of gate oxide degradation mechanisms in trench-gated power MOSFETs using the charge-pumping technique
Dolny, G., Gollagunta, N., Suliman, S., Trabzon, L., Horn, M., Awadelkarim, O.O., Fonash, S.J., Knoedler, C.M., Hao, J., Ridley, R., Kocon, C., Grebs, T., Zeng, J.
Published in Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) (2001)
Published in Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) (2001)
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Conference Proceeding