Single event effects in PDSOI 4 M SRAM fabricated in UNIBOND
Liu, S.T., Heikkila, W.W., Golke, K.W., Anthony, D., Hurst, A., Kirchner, G., Jenkins, W.C., Hughes, H.L., Mitra, S., Ioannou, D.E.
Published in IEEE transactions on nuclear science (01.12.2003)
Published in IEEE transactions on nuclear science (01.12.2003)
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Journal Article
Proton induced single event upset in a 4M SOI SRAM
Liu, H. Y., Liu, S.T., Golke, K.W., Nelson, D.K., Heikkila, W.W., Jenkins, W.C.
Published in 2003 IEEE International Conference on SOI (2003)
Published in 2003 IEEE International Conference on SOI (2003)
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Conference Proceeding
Limiting Upset Cross Sections of SEU Hardened SOI SRAMs
Liu, M.S., Liu, H.Y., Brewster, N., Nelson, D., Golke, K.W., Kirchner, G., Hughes, H.L., Campbell, A., Ziegler, J.F.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
A new dose rate model for SOI MOSFETs and its implementation in SPICE
Liu, H.Y., Golke, K.W., Liu, S.T.
Published in 2005 IEEE International SOI Conference Proceedings (2005)
Published in 2005 IEEE International SOI Conference Proceedings (2005)
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Conference Proceeding
Determination of funnel length from cross section versus LET measurements
Golke, K.W.
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) (01.12.1993)
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Journal Article
Conference Proceeding