Shallow Trench Isolation Patterning to Improve Photon Detection Probability of Single-Photon Avalanche Diodes Integrated in FD-SOI CMOS Technology
Gao, Shaochen, Duc-Tung Vu, Cazimajou, Thibauld, Pittet, Patrick, Martine Le Berre, Lakeh, Mohammadreza Dolatpoor, Mandorlo, Fabien, Orobtchouk, Régis, Schell, Jean-Baptiste, Kammerer, Jean-Baptiste, Cathelin, Andreia, Golanski, Dominique, Uhring, Wilfried, Calmon, Francis
Published in Photonics (01.06.2024)
Published in Photonics (01.06.2024)
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Journal Article
A band-modulation device in advanced FDSOI technology: Sharp switching characteristics
El Dirani, Hassan, Solaro, Yohann, Fonteneau, Pascal, Legrand, Charles-Alex, Marin-Cudraz, David, Golanski, Dominique, Ferrari, Philippe, Cristoloveanu, Sorin
Published in Solid-state electronics (01.11.2016)
Published in Solid-state electronics (01.11.2016)
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Journal Article
Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices
Helleboid, Remi, Rideau, Denis, Grebot, Jeremy, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Basset, Marie, Zimmer, Antonin, Mamdy, Bastien, Golanski, Dominique, Agnew, Megan, Pellegrini, Sara, Sicre, Mathieu, Buj, Christel, Marchand, Guillaume, Saint-Martin, Jerome, Pala, Marco, Dollfus, Philippe
Published in IEEE journal of the Electron Devices Society (2022)
Published in IEEE journal of the Electron Devices Society (2022)
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Journal Article
High-Q MOS Varactors for Millimeter-Wave Applications in CMOS 28-nm FDSOI
Quemerais, Thomas, Gloria, Daniel, Golanski, Dominique, Bouvot, Simon
Published in IEEE electron device letters (01.02.2015)
Published in IEEE electron device letters (01.02.2015)
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Journal Article
A Fokker–Planck-based Monte Carlo method for electronic transport and avalanche simulation in single-photon avalanche diodes
Helleboid, Rémi, Rideau, Denis, Nicholson, Isobel, Grebot, Jeremy, Mamdy, Bastien, Mugny, Gabriel, Basset, Marie, Agnew, Megan, Golanski, Dominique, Pellegrini, Sara, Saint-Martin, Jérôme, Pala, Marco, Dollfus, Philippe
Published in Journal of physics. D, Applied physics (15.12.2022)
Published in Journal of physics. D, Applied physics (15.12.2022)
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Journal Article
An analytical solution for McIntyre’s model of avalanche triggering probability for SPAD compact modeling and performance exploration
Chaves De Albuquerque, Tulio, Issartel, Dylan, Gao, Shaochen, Benhammou, Younes, Golanski, Dominique, Clerc, Raphaël, Calmon, Francis
Published in Semiconductor science and technology (01.08.2021)
Published in Semiconductor science and technology (01.08.2021)
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Journal Article
Dual Ground Plane for high-voltage MOSFET in UTBB FDSOI technology
Litty, Antoine, Ortolland, Sylvie, Golanski, Dominique, Cristoloveanu, Sorin
Published in Solid-state electronics (01.10.2015)
Published in Solid-state electronics (01.10.2015)
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Journal Article
Dual Ground Plane EDMOS in 28nm FDSOI for 5V power management applications
Litty, Antoine, Ortolland, Sylvie, Golanski, Dominique, Cristoloveanu, Sorin
Published in Solid-state electronics (01.11.2015)
Published in Solid-state electronics (01.11.2015)
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Journal Article
Indirect avalanche event detection of Single Photon Avalanche Diode implemented in CMOS FDSOI technology
Chaves de Albuquerque, Tulio, Issartel, Dylan, Clerc, Raphaël, Pittet, Patrick, Cellier, Rémy, Golanski, Dominique, Jouan, Sébastien, Cathelin, Andreia, Calmon, Francis
Published in Solid-state electronics (01.01.2020)
Published in Solid-state electronics (01.01.2020)
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Journal Article
STI patterning to improve FSI PDP of SPAD integrated in FD-SOI CMOS technology
Gao, Shaochen, Duc-Tung, Vu, Cazimajou, Thibauld, Pittet, Patrick, Le Berre, Martine, Dolatpoor Lakeh, Mohammadreza, Mandorlo, Fabien, Orobtchouk, Régis, Schell, Jean-Baptiste, Kammerer, Jean-Baptiste, Cathelin, Andreia, Golanski, Dominique, Uhring, Wilfried, Calmon, Francis
Published in Photonics (01.06.2024)
Published in Photonics (01.06.2024)
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Journal Article
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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Conference Proceeding
Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices
Helleboid, Remi, Rideau, Denis, Nicholson, Isobel, Moussy, Norbert, Saxod, Olivier, Basset, Marie, Grebot, Jeremy, Zimmerman, Antonin, Mamdy, Bastien, Golanski, Dominique, Agnew, Megan, Pellegrini, Sara, Sicre, Mathieu
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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Conference Proceeding
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Sicre, Mathieu, Agnew, Megan, Buj, Christel, Coignus, Jean, Golanski, Dominique, Helleboid, Remi, Mamdy, Bastien, Nicholson, Isobel, Pellegrini, Sara, Rideau, Denis, Roy, David, Calmon, Francis
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
Published in ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC) (13.09.2021)
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Conference Proceeding
Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs
Rideau, D., Uhring, W., Bianchi, R. A., Helleboid, R., Mugny, G., Grebot, J., Manouvrier, J.R., Neri, R., Brun, F., Lakeh, M. Dolatpoor, Rink, S., Kammerer, J-B., Lallement, C., Lacombe, E., Golanski, D., Rae, B., Bah, T. M., Twaddle, F., Quenette, V., Marchand, G., Buj, C., Fillon, R., Henrion, Y., Nicholson, I., Agnew, M., Basset, M., Perrier, R., Al-Rawhani, M., Mamdy, B., Pellegrin, S., Gouget, G., Maciazek, P., Juge, A., Dartigues, A., Alause, H. Wehbe
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11.09.2023)
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Conference Proceeding