Emissivity measurements and modeling of silicon-related materials: An overview
RAVINDRA, N. M, SOPORI, B, GOKCE, O. H, CHENG, S. X, SHENOY, A, JIN, L, ABEDRABBO, S, CHEO, W, ZHANG, Y
Published in International journal of thermophysics (2001)
Published in International journal of thermophysics (2001)
Get full text
Conference Proceeding
Effects of annealing on X-ray-amorphous CVD W-Si-N barrier layer materials
Gokce, O.H., Amin, S., Ravindra, N.M., Szostak, D.J., Paff, R.J., Fleming, J.G., Galewski, C.J., Shallenberger, J., Eby, R.
Published in Thin solid films (29.09.1999)
Published in Thin solid films (29.09.1999)
Get full text
Journal Article
Radiative properties of SIMOX
Ravindra, N.M., Abedrabbo, S., Gokce, O.H., Tong, F., Patel, A., Velagapudi, R., Williamson, G.D., Maszara, W.P.
Published in IEEE transactions on components, packaging, and manufacturing technology. Part A (01.09.1998)
Published in IEEE transactions on components, packaging, and manufacturing technology. Part A (01.09.1998)
Get full text
Journal Article