by Ingelsson, Urban, Goel, Sandeep Kumar, Larsson, Erik, Marinissen, Erik Jan
Published in IEEE transactions on computers (01.12.2015)

by CHANDRA ANSHUMAN, GOEL SANDEEP KUMAR
Year of Publication 23.11.2023

by PATIDAR ANKITA, GOEL SANDEEP KUMAR, LEE YUN HAN
Year of Publication 10.01.2023

by WANG MING YIH, HUNG TSUNG YANG, LIN CHENG YI, PATIDAR ANKITA, GOEL SANDEEP KUMAR
Year of Publication 25.01.2023

by GOEL SANDEEP KUMAR
Year of Publication 26.03.2015

by GOEL SANDEEP KUMAR
Year of Publication 25.03.2015

by Deutsch, S., Keller, B., Chickermane, V., Mukherjee, S., Sood, N., Goel, S. K., Chen, J., Mehta, A., Lee, F., Marinissen, E. J.
Published in 2012 IEEE International Test Conference (01.11.2012)

by KOTHA VINAY, PATIDAR ANKITA, GOEL SANDEEP KUMAR, LEE YUN HAN
Year of Publication 06.01.2020

by Goel, S.K., Marinissen, E.J.
Published in Proceedings - International Test Conference (2002)

by Goel, S.K., Devta-Prasanna, N., Ward, M.
Published in 2009 International Test Conference (01.11.2009)

by GOEL SANDEEP KUMAR, LEE YUN HAN, HOU YUNG CHIN
Year of Publication 16.06.2017

by Gope, Deepayan, Goel, Sandeep Kumar
Published in International journal of emerging electric power systems (24.02.2021)

by GOEL SANDEEP KUMAR, ADHAM SAMAN M. I, LEE YUN HAN
Year of Publication 26.09.2016

by JOHN STANLEY, GOEL SANDEEP KUMAR, HUANG TZE CHIANG, LEE YUN HAN
Year of Publication 13.04.2017

by Vermeulen, B., Waayers, T., Goel, S.K.
Published in Proceedings - International Test Conference (2002)

by Goel, Sandeep Kumar, Pendharkar, Sandeep, Liu, Chunsheng
Published in 2022 IEEE 40th VLSI Test Symposium (VTS) (25.04.2022)

by Lin, Mu-Shan, Huang, Tze-Chiang, Tsai, Chien-Chun, Tam, King-Ho, Hsieh, Cheng-Hsiang, Chen, Tom, Huang, Wen-Hung, Hu, Jack, Chen, Yu-Chi, Goel, Sandeep Kumar, Fu, Chin-Ming, Rusu, Stefan, Li, Chao-Chieh, Yang, Sheng-Yao, Wong, Mei, Yang, Shu-Chun, Lee, Frank
Published in 2019 Symposium on VLSI Circuits (01.06.2019)

by GOEL SANDEEP KUMAR, DEVTA PRASANNA NARENDRA, GUNDA ARUN K
Year of Publication 27.10.2011

by Sehgal, A., Goel, S.K., Marinissen, E.J., Chakrabarty, K.
Published in 2004 International Conferce on Test (2004)

by Goel, S.K., Vermeulen, B.
Published in Proceedings - International Test Conference (2002)