by Paul, G., Khan, A., Zeiger, M., Cohn, A., Dramon, D., Le, D., Naviasky, E., Grigoriants, E., Malkin, G., Malobani, I., Yanuka, I., Yu, J., Kung, J., Gnor, L., Shiterit, M., Rozen, R., Gabe, R., Hadas, S., Kelly, T., Wilson, T., Nguyen, T., Evans, W., Hayon, Y.
Published in 2004 IEEE International Solid-State Circuits Conference (IEEE Cat. No.04CH37519) (2004)