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"Gneupel, Andreas"
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Characterization of critical conditions for fracture during wafer testing by FEM and experiments
by
Ochoa Brezmes, Angel
,
Reuther, Georg
,
Gneupel
,
Andreas
,
Breitkopf, Cornelia
Published in
Materials science in semiconductor processing
(15.08.2017)
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Prober with cooling mechanism for directly cooling a device under test
by
Gneupel
,
Andreas
Year of Publication
25.10.2022
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Prober with busbar mechanism for testing a device under test
by
Gneupel
,
Andreas
Year of Publication
19.04.2022
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PROBER WITH COOLING MECHANISM FOR DIRECTLY COOLING A DEVICE UNDER TEST
by
GNEUPEL
,
Andreas
Year of Publication
29.04.2021
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PROBER WITH BUSBAR MECHANISM FOR TESTING A DEVICE UNDER TEST
by
Gneupel
,
Andreas
Year of Publication
06.08.2020
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Prober mit Kühlmechanismus zum direkten Kühlen einer zu prüfenden Vorrichtung
by
Gneupel
,
Andreas
Year of Publication
29.04.2021
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PROBER WITH BUSBAR MECHANISM FOR TESTING A DEVICE UNDER TEST
by
GNEUPEL ANDREAS
Year of Publication
25.08.2020
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PRÜFVORRICHTUNG MIT SAMMELSCHIENENMECHANISMUS ZUM TESTEN EINER ZU TESTENDEN VORRICHTUNG
by
Gneupel
,
Andreas
Year of Publication
09.07.2020
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POWER SEMICONDUCTOR DEVICE, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A CURRENT OF A POWER SEMICONDUCTOR DEVICE
by
Balashov, Dmitry
,
Gneupel
,
Andreas
,
Springer, Richard
,
Kemle, Christian
,
Böhm, Markus
,
Dirnstorfer, Ingo
Year of Publication
28.03.2024
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LEISTUNGS-HALBLEITERVORRICHTUNG, MESSSYSTEM UND VERFAHREN ZUM BESTIMMEN EINES STROMS EINER LEISTUNGS-HALBLEITERVORRICHTUNG
by
Balashov, Dmitry
,
Kernle, Christian
,
Gneupel
,
Andreas
,
Springer, Richard
,
Dirnstorfer, Ingo
,
Boehm, Markus
Year of Publication
28.03.2024
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