by Kloes, Alexander, Leise, Jakob, Pruefer, Jakob, Nikolaou, Aristeidis, Iniguez, Benjamin, Gneiting, Thomas, Klauk, Hagen, Darbandy, Ghader
Published in IEEE journal of the Electron Devices Society (01.01.2023)

by Muhea, Wondwosen E., Castillo, Gerard U., Ordonez, Harold C., Gneiting, Thomas, Ghibaudo, Gerard, Iniguez, Benjamin
Published in IEEE journal of the Electron Devices Society (2020)

by Iniguez, Benjamin, Nathan, Arokia, Kloes, Alexander, Bonnassieux, Yvan, Romanjek, Krunoslav, Charbonneau, Micael, Steen, Jan Laurens Van Der, Gelinck, Gerwin, Gneiting, Thomas, Mohamed, Firas, Ghibaudo, Gerard, Cerdeira, Antonio, Estrada, Magali, Mijalkovic, Slobodan, Nejim, Ahmed
Published in IEEE journal of the Electron Devices Society (2021)

by Griebel, J, Mayr, N A, de Vries, A, Knopp, M V, Gneiting, T, Kremser, C, Essig, M, Hawighorst, H, Lukas, P H, Yuh, W T
Published in Journal of magnetic resonance imaging (01.01.1997)

by Debbage, Paul L, Griebel, Jurgen, Ried, Monika, Gneiting, Thomas, DeVries, Alexander, Hutzler, Peter
Published in The journal of histochemistry and cytochemistry (01.05.1998)

by Albahrani, Sayed Ali, Heuken, Lars, Schwantuschke, Dirk, Gneiting, Thomas, Burghartz, Joachim N., Khandelwal, Sourabh
Published in IEEE transactions on electron devices (01.02.2020)

by Albahrani, Sayed Ali, Mahajan, Dhawal, Kargarrazi, Saleh, Schwantuschke, Dirk, Gneiting, Thomas, Senesky, Debbie G., Khandelwal, Sourabh
Published in IEEE transactions on electron devices (01.02.2020)

by Pruefer, Jakob, Leise, Jakob, Nikolaou, Aristeidis, Borchert, James W., Darbandy, Ghader, Klauk, Hagen, Iniguez, Benjamin, Gneiting, Thomas, Kloes, Alexander
Published in IEEE transactions on electron devices (01.08.2021)

by Pruefer, Jakob, Leise, Jakob, Borchert, James W., Klauk, Hagen, Darbandy, Ghader, Nikolaou, Aristeidis, Iniguez, Benjamin, Gneiting, Thomas, Kloes, Alexander
Published in IEEE transactions on electron devices (01.03.2022)

by Pruefer, Jakob, Leise, Jakob, Darbandy, Ghader, Nikolaou, Aristeidis, Klauk, Hagen, Borchert, James W., Iniguez, Benjamin, Gneiting, Thomas, Kloes, Alexander
Published in IEEE transactions on electron devices (01.11.2020)

by Nekolla, S, Gneiting, T, Syha, J, Deichmann, R, Haase, A
Published in Journal of computer assisted tomography (01.03.1992)

by Hao Zou, Moursy, Yasser, Iskander, Ramy, Chaput, Jean-Paul, Louerat, Marie-Minerve, Stefanucci, Camillo, Buccela, Pietro, Kayal, Maher, Sallese, Jean-Michel, Gneiting, Thomas, Alius, Heidrun, Steinmair, Alexander, Seebacher, Ehrenfried
Published in 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) (01.06.2015)

by KHANDELWAL, Sourabh, SHARMA, Surya, SINGH CHAUHAN, Yogesh, GNEITING, Thomas, FJELDLY, Tor A
Published in IEEE transactions on electron devices (2013)

by Darbandy, Ghader, Gneiting, Thomas, Alius, Heidrun, Alvarado, Joaquín, Cerdeira, Antonio, Iñiguez, Benjamin
Published in Semiconductor science and technology (10.05.2013)

by MAVREDAKIS, Nikolaos, BUCHER, Matthias, FRIEDRICH, Roland, BAZIGOS, Antonios, KRUMMENACHER, François, SALLESE, Jean-Michel, GNEITING, Thomas, PFLANZL, Walter, SEEBACHER, Ehrenfried
Published in IEEE transactions on electron devices (2013)

by GNEITING THOMAS, LAPPOEHN JUERGEN, MOEDINGER ROLAND, MOLITOR STEFAN
Year of Publication 06.03.2017

by Khandelwal, S., Sharma, S., Chauhan, Y. S., Gneiting, T., Fjeldly, T. A.
Published in IEEE transactions on electron devices (01.02.2013)

by Darbandy, Ghader, Gneiting, Thomas, Alius, Heidrun, Alvarado, Joaquín, Cerdeira, Antonio, Iñiguez, Benjamin
Published in Solid-state electronics (01.11.2013)

by Mavredakis, N., Bucher, M., Friedrich, R., Bazigos, A., Krummenacher, F., Sallese, J., Gneiting, T., Pflanzl, W., Seebacher, E.
Published in IEEE transactions on electron devices (01.02.2013)

by Moursy, Yasser, Hao Zou, Iskander, Ramy, Tisserand, Pierre, Dieu-My Ton, Pasetti, Giuseppe, Seebacher, Ehrenfried, Steinmair, Alexander, Gneiting, Thomas, Alius, Heidrun
Published in 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2016)