by Jin, Y., Teo, W.Y., Hou, Y.T., Gn, F.H., Lim, H.F., Han, Z.Y., Li, M.F.
Published in 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) (2002)

by Tanya Yang, Hun Chow Lee, Lim, V., Gn, F. H., Mardiyono, T., Qionghan Wang, Long Phan Nguyen, Fei Li, Sa Zhao, Inani, A.
Published in 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (01.05.2011)

by Jin, Y., Lim, H.F., Tong, A.F., Gn, F.H., Low, A.S., Teo, W.Y., Hou, Y.T., Li, M.F.
Published in 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) (2001)

by YAP, C. W, SIAH, S.-Y, LIM, E. H, LEE, T. K, GN, F. H
Year of Publication 1999

by Toh, S.L., Deng, Q., Tang, W.T., Lim, V., Gn, F.H., Tan, P.K., Tan, H., Mai, Z.H., Lam, J.
Published in 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2008)

by Teo, J.W.Y., Lim, H.W., Jin, Y., Huang, J.H., Chew, W.C., Leong, C.K., Gn, F.H., Li, M.F., Su, G.
Published in Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) (2001)