Automotive 130 nm smart-power-technology including embedded flash functionality
Rudolf, R., Wagner, C., O'Riain, L., Gebhardt, K., Kuhn-Heinrich, B., von Ehrenwall, B., von Ehrenwall, A., Strasser, M., Stecher, M., Glaser, U., Aresu, S., Kuepper, P., Mayerhofer, A.
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)
Published in 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs (01.05.2011)
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Conference Proceeding
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology
Heer, Michael, Domański, Krzysztof, Esmark, Kai, Glaser, Ulrich, Pogany, Dionyz, Gornik, Erich, Stadler, Wolfgang
Published in Microelectronics and reliability (01.12.2009)
Published in Microelectronics and reliability (01.12.2009)
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Journal Article
INTEGRATED CIRCUIT WITH ESD PROTECTION STRUCTURE AND PHOTON SOURCE
MEISER ANDREAS, CAO YIQUN, HELL MAGNUS MARIA, MAYERHOFER MICHAEL, STECHER MATTHIAS, WILLEMEN JOOST, LEBON JULIEN, GLASER ULRICH
Year of Publication 07.09.2015
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Year of Publication 07.09.2015
Patent
A failure levels study of non-snapback ESD devices for automotive applications
Yiqun Cao, Glaser, U, Frei, S, Stecher, M
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)
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Conference Proceeding
SCR operation mode of diode strings for ESD protection
Glaser, Ulrich, Esmark, Kai, Streibl, Martin, Russ, Christian, Domański, Krzysztof, Ciappa, Mauro, Fichtner, Wolfgang
Published in Microelectronics and reliability (01.07.2007)
Published in Microelectronics and reliability (01.07.2007)
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Journal Article
Conference Proceeding
Application Example of a Novel Methodology to Generate IC Models for System ESD and Electrical Stress Simulation out of the Design Data
Ammer, Michael, Rupp, Andreas, Glaser, Ulrich, Cao, Yiqun, Sauter, Martin, Maurer, Linus
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
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Conference Proceeding
Simulation Driven ESD Current Density Check
Glaser, Ulrich, Stoica, Radu, Ionescu, Radu, Preda, Marcel, Morgenstern, Haiko, Nassar, Doaa, Marquardt, Hartmut
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
Published in 2019 41st Annual EOS/ESD Symposium (EOS/ESD) (01.09.2019)
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Conference Proceeding
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology : Electrostatic Discharge Reliability
HEER, Michael, DOMANSKI, Krzysztof, ESMARK, Kai, GLASER, Ulrich, POGANY, Dionyz, GORNIK, Erich, STADLER, Wolfgang
Published in Microelectronics and reliability (2009)
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Published in Microelectronics and reliability (2009)
Conference Proceeding
Active clamp design for on-chip GUN protection
Rupp, Andreas, Glaser, Ulrich, Yiqun Cao
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
Published in 2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) (01.09.2015)
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Conference Proceeding