Single-Event Burnout and Avalanche Characteristics of Power DMOSFETs
Liu, S., Boden, M., Girdhar, D.A., Titus, J.L.
Published in IEEE transactions on nuclear science (01.12.2006)
Published in IEEE transactions on nuclear science (01.12.2006)
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Journal Article
600V depletion stop trench IGBTs for appliance applications
Sodhi, R., Girdhar, D.A., Chiu Ng, Jie Zhang, Bolloju, V.
Published in 2006 India International Conference on Power Electronics (01.12.2006)
Published in 2006 India International Conference on Power Electronics (01.12.2006)
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Conference Proceeding