Determination of the stress level for voltage screen of integrated circuits
Kho, R.M., Moonen, A.J., Girault, V.M., Bisschop, J., Olthof, E.H.T., Nath, S., Liang, Z.N.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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