Adaptive Clock Gating for Improving Wear out induced Duty Cycle Shift in the Clock Network
Cho, Minki, Gill, Balkaran, Sharma, Rahul, Gupta, Shiv
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
Published in 2024 IEEE International Reliability Physics Symposium (IRPS) (14.04.2024)
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Conference Proceeding
Soft Error Rate Improvements in 14-nm Technology Featuring Second-Generation 3D Tri-Gate Transistors
Seifert, Norbert, Jahinuzzaman, Shah, Velamala, Jyothi, Ascazubi, Ricardo, Patel, Nikunj, Gill, Balkaran, Basile, Joseph, Hicks, Jeffrey
Published in IEEE transactions on nuclear science (01.12.2015)
Published in IEEE transactions on nuclear science (01.12.2015)
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Journal Article
Soft Error Susceptibilities of 22 nm Tri-Gate Devices
Seifert, N., Gill, B., Jahinuzzaman, S., Basile, J., Ambrose, V., Quan Shi, Allmon, R., Bramnik, A.
Published in IEEE transactions on nuclear science (01.12.2012)
Published in IEEE transactions on nuclear science (01.12.2012)
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Journal Article
Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform
Sutaria, Ketul B., Cho, Minki, Rahman, Anisur, Standfest, Jihan, Sharma, Rahul, Namalapuri, Swaroop, Gupta, Shiv, Ajdari, Bahar, Ascazubi, Ricardo, Gill, Balkaran
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
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Conference Proceeding
The Susceptibility of 45 and 32 nm Bulk CMOS Latches to Low-Energy Protons
Seifert, N., Gill, B., Pellish, J. A., Marshall, P. W., LaBel, K. A.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits
Sutaria, Ketul B., Standfest, Jihan, Meric, Inanc, Davoody, Amirhossein H., Kumar Namalapuri, Swaroop, Mutyala, T., P., Supriya, Gill, Balkaran, Ramey, Stephen, Hicks, Jeffery
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
Combinational Logic Soft Error Correction
Mitra, S., Ming Zhang, Waqas, S., Seifert, N., Gill, B., Kee Sup Kim
Published in 2006 IEEE International Test Conference (01.10.2006)
Published in 2006 IEEE International Test Conference (01.10.2006)
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Conference Proceeding
HIGH DOSE RADIATION DETECTOR
YANG XIAOFENG, GILL BALKARAN SINGH, MAIZ JOSE A, SEIFERT NORBERT R, KORNFELD AVNER
Year of Publication 28.08.2014
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Year of Publication 28.08.2014
Patent
Radiation-induced clock jitter and race
Seifert, N., Shipley, P., Pant, M.D., Ambrose, V., Gill, B.
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
Published in 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual (2005)
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Conference Proceeding
On the Scalability of Redundancy based SER Mitigation Schemes
Seifert, N., Gill, B., Zia, V., Ming Zhang, Ambrose, V.
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
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Conference Proceeding
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories
Gill, Balkaran, Nicolaidis, Michael, Wolff, Francis, Papachristou, Chris, Garverick, Steven
Published in Design, Automation and Test in Europe (07.03.2005)
Published in Design, Automation and Test in Europe (07.03.2005)
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Conference Proceeding