by Virmontois, C., Belloir, J.-M., Pistre, L., Patier, L., Gilard, O., Bardoux, A., Goiffon, V., Reverchon, J.-L., Colin, T., Berdin, E., Saint-Pe, O.
Published in IEEE transactions on nuclear science (01.05.2021)

by Artola, L., Hubert, G., Gilard, O., Ducret, S., Perrier, F., Boutillier, M., Garcia, P., Vignon, G., Baradat, B., Ricard, Nicolas
Published in IEEE transactions on nuclear science (01.12.2015)

by Nuns, T., David, J.-P, Soonckindt, S., Gilard, O., Perrier, F., Ducret, S., Sanchez, K.
Published in IEEE transactions on nuclear science (01.12.2014)

by Berne, O., Caussanel, M., Gilard, O.
Published in IEEE photonics technology letters (01.10.2004)

by Nuns, T., Quadri, G., David, J.-P., Gilard, O.
Published in IEEE transactions on nuclear science (01.08.2007)

by Gilard, O., Boutillier, M., Quadri, G., Rolland, G., Germanicus, R.
Published in IEEE transactions on nuclear science (01.12.2008)

by Spezzigu, P., Bechou, L., Quadri, G., Gilard, O., Ousten, Y., Vanzi, M.
Published in Microelectronics and reliability (01.09.2011)

by Gauffier, A., David, J.-P., Gilard, O., Nuns, T., Inguimbert, C., Balocchi, A.
Published in IEEE transactions on nuclear science (01.08.2009)

by Penquer, A., Boutillier, M., Rolland, G., Gilard, O., Fougnie, B., Porez, F.
Published in IEEE transactions on nuclear science (01.08.2009)

by Boutillier, M., Gilard, O., Quadri, G., Lhuillier, S., How, L. S., Hernandez, S.
Published in 2014 IEEE Radiation Effects Data Workshop (REDW) (01.07.2014)

by Bechou, L., Rehioui, O., Deshayes, Y., Gilard, O., Quadri, G., Ousten, Y.
Published in Optics and laser technology (01.06.2008)

by Nuns, T., Quadri, G., David, J.-P., Gilard, O., Boudou, N.
Published in IEEE transactions on nuclear science (01.08.2006)

by CAUSSANEL, M, GILARD, O, SOTOM, M, SIGNORET, P, GASIOT, J
Published in Electronics letters (17.02.2005)

by Boutillier, M., Gauthier-Lafaye, O., Bonnefont, S., Lozes-Dupuy, F., Lagarde, D., Lombez, L., Marie, X., Ligeret, V., Parillaud, O., Krakowski, M., Gilard, O.
Published in IEEE transactions on nuclear science (01.08.2009)

by Spezzigu, P., Caddeo, C., Quadri, G., Gilard, O., Bechou, L., Ousten, Y., Vanzi, M.
Published in IEEE transactions on nuclear science (01.08.2009)

by Boutillier, M.., Gauthier-Lafaye, O.., Bonnefont, S.., Lozes-Dupuy, F.., Lombez, L.., Lagarde, D.., Marie, X.., Vermersch, F.-J.., Calligaro, M.., Lecomte, M.., Parillaud, O.., Krakowski, M.., Gilard, O..
Published in IEEE transactions on nuclear science (01.08.2007)

by Bourqui, M.L., Béchou, L., Gilard, O., Deshayes, Y., Vecchio, P. Del, How, L.S., Rosala, F., Ousten, Y., Touboul, A.
Published in Microelectronics and reliability (01.08.2008)

by Quadri, G., Nicot, J.-M., Guibaud, G., Gilard, O.
Published in IEEE transactions on nuclear science (01.10.2005)

by Joly, S., Ouattara, M., Guibault, G., How, Lip Sun, Bechou, L., Gilard, O., Deshayes, Y.
Published in Microelectronics and reliability (01.11.2023)

by Boutillier, M., Gauthier-Lafaye, O., Bonnefont, S., Lozes-Dupuy, F., Vermersch, F.-J., Krakowski, M., Gilard, O.
Published in Microelectronics and reliability (01.09.2006)