Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories
Kim, Shinkeun, Kim, Haesoo, Woo, Changbeom, Choi, Gil-Bok, Seo, Moon-Sik, Shim, Hyunyoung, Noh, Keum Hwan, Shin, Hyungcheol
Published in IEEE transactions on electron devices (01.06.2020)
Published in IEEE transactions on electron devices (01.06.2020)
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Journal Article
Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories
Woo, Changbeom, Kim, Shinkeun, Park, Jaeyeol, Shin, Hyungcheol, Kim, Haesoo, Choi, Gil-Bok, Seo, Moon-Sik, Noh, Keum Hwan
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
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Conference Proceeding
On the RF Series Resistance Extraction of Nanoscale MOSFETs
CHOI, Gil-Bok, HONG, Seung-Ho, JUNG, Sung-Woo, JEONG, Yoon-Ha
Published in IEEE microwave and wireless components letters (01.10.2008)
Published in IEEE microwave and wireless components letters (01.10.2008)
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Journal Article
염화세틸피리디늄 및 아세트산 아연을 함유한 구강 양치액의 효과
문예림, Ye-rim Mun, 최길복, Gil-bok Choi, 김다희, Da-hui Kim, 조자원, Ja-won Cho, 예재승, Jae-seung Yea
Published in 대한구강보건학회지 (30.06.2023)
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Published in 대한구강보건학회지 (30.06.2023)
Journal Article
Low-Temperature Performance of Nanoscale MOSFET for Deep-Space RF Applications
HONG, Seung-Ho, CHOI, Gil-Bok, BAEK, Rock-Hyun, KANG, Hee-Sung, JUNG, Sung-Woo, JEONG, Yoon-Ha
Published in IEEE electron device letters (01.07.2008)
Published in IEEE electron device letters (01.07.2008)
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Journal Article
RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization
Sungho Kim, Myeongwon Lee, Gil-Bok Choi, Jaekwan Lee, Yunbong Lee, Myoungkwan Cho, Kun-Ok Ahn, Jinwoong Kim
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
Published in 2015 IEEE International Reliability Physics Symposium (01.04.2015)
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Conference Proceeding
The Effect of a Si Capping Layer on RF Characteristics of High- k /Metal Gate SiGe Channel pMOSFETs
Min Sang Park, Kyong Taek Lee, Chang Yong Kang, Gil-Bok Choi, Hyun Chul Sagong, Chang Woo Sohn, Byoung-Gi Min, Jungwoo Oh, Majhi, Prashant, Hsing-Huang Tseng, Lee, Jack C, Jeong-Soo Lee, Jammy, Raj, Yoon-Ha Jeong
Published in IEEE electron device letters (01.10.2010)
Published in IEEE electron device letters (01.10.2010)
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Journal Article
Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories
Woo, Changbeom, Lee, Myeongwon, Kim, Shinkeun, Park, Jaeyeol, Choi, Gil-Bok, Seo, Moon-sik, Noh, Keum Hwan, Kang, Myounggon, Shin, Hyungcheol
Published in 2019 Symposium on VLSI Technology (01.06.2019)
Published in 2019 Symposium on VLSI Technology (01.06.2019)
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Conference Proceeding
New analog predistorer using mixing operation for independent control of IM3 components
Lee, Yong-Sub, Lee, Mun-Woo, Choi, Gil-bok, Jeong, Yoon-Ha
Published in Microwave and optical technology letters (01.10.2007)
Published in Microwave and optical technology letters (01.10.2007)
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Journal Article
교정환자의 의료서비스 질 만족과 가치만족이 재이용의사에 미치는 영향
민희홍, Hee Hong Min, 전지현, Ji Hyun Jeon, 최길복, Gil Bok Choi
Published in Han'guk Ch'iwisaeng Hakhoe chi (30.04.2016)
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Published in Han'guk Ch'iwisaeng Hakhoe chi (30.04.2016)
Journal Article