by Gierczynski, N., Borot, B., Planes, N., Brut, H.
Published in 2007 IEEE International Conference on Microelectronic Test Structures (01.03.2007)

by Nowak, E., Denais, M., Gierczynski, N.
Published in 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual (01.04.2007)

by Muller, M., Mondot, A., Aime, D., Gierczynski, N., Ribes, G., Skotnicki, T.
Published in 2006 IEEE International Conference on IC Design and Technology (2006)

by Vandooren, A., Hobbs, C., Faynot, O., Perreau, P., Denorme, S., Fenouillet-Beranger, C., Gallon, C., Morin, C., Zauner, A., lmbert, G., Bernard, H., Garnier, P., Gabette, L., Broekaart, M., Aminpur, M., Barnola, S., Loubet, N., Dutartre, D., Korman, T., Chabanne, G., Martin, F., Le Tiec, Y., Gierczynski, N., Smith, S., Laviron, C., Bidaud, M., Pouilloux, I., Bensahel, D., Skotnicki, T., Mingam, H., Wild, A.
Published in 2005 IEEE International SOI Conference Proceedings (2005)

by Boeuf, F., Arnaud, F., Boccaccio, C., Salvetti, F., Todeschini, J., Pain, L., Jurdit, M., Manakli, S., Icard, B., Planes, N., Gierczynski, N., Denorme, S., Borot, B., Ortolland, C., Duriez, B., Tavel, B., Gouraud, P., Broekaart, M., Dejonghe, V., Brun, P., Guyader, F., Morini, P., Reddy, C., Aminpur, M., Laviron, C., Smith, S., Jacquemin, J.P., Mellier, M., Andre, F., Bicais-Lepinay, N., Jullian, S., Bustos, J., Skotnicki, T.
Published in Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005 (2005)

by Muller, M., Mondot, A., Gierczynski, N., Aime, D., Froment, B., Leverd, F., Gouraud, P., Talbot, A., Descombes, S., Morand, Y., Le Tiec, Y., Besson, P., Toffoli, A., Ribes, G., Roux, J.-M., Pokrant, S., Andre, F., Skotnicki, T.
Published in IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest (2005)