Electron valence-band tunnelling excess noise in twin-gate silicon-on-insulator MOSFETs
Simoen, E., Claeys, C., Lukyanchikova, N., Garbar, N., Smolanka, A., Ghedini Der Agopian, P., Martino, J.A.
Published in Solid-state electronics (2006)
Published in Solid-state electronics (2006)
Get full text
Journal Article
Conference Proceeding