A Cache-Assisted Scratchpad Memory for Multiple-Bit-Error Correction
Farbeh, Hamed, Mirzadeh, Nooshin Sadat, Ghalaty, Nahid Farhady, Miremadi, Seyed-Ghassem, Fazeli, Mahdi, Asadi, Hossein
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2016)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2016)
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Journal Article
A Low Area Overhead NBTI/PBTI Sensor for SRAM Memories
Karimi, Maryam, Rohbani, Nezam, Miremadi, Seyed-Ghassem
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2017)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.11.2017)
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Journal Article
A low-overhead and reliable switch architecture for Network-on-Chips
Patooghy, Ahmad, Ghassem Miremadi, Seyed, Fazeli, Mahdi
Published in Integration (Amsterdam) (01.06.2010)
Published in Integration (Amsterdam) (01.06.2010)
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Journal Article
An efficient numerical-based crosstalk avoidance codec design for NoCs
Shirmohammadi, Zahra, Mozafari, Fereshte, Miremadi, Seyed-Ghassem
Published in Microprocessors and microsystems (01.05.2017)
Published in Microprocessors and microsystems (01.05.2017)
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Journal Article
A fast, flexible, and easy-to-develop FPGA-based fault injection technique
Ebrahimi, Mojtaba, Mohammadi, Abbas, Ejlali, Alireza, Miremadi, Seyed Ghassem
Published in Microelectronics and reliability (01.05.2014)
Published in Microelectronics and reliability (01.05.2014)
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Journal Article
Efficient algorithms to accurately compute derating factors of digital circuits
Asadi, Hossein, Tahoori, Mehdi B., Fazeli, Mahdi, Miremadi, Seyed Ghassem
Published in Microelectronics and reliability (01.06.2012)
Published in Microelectronics and reliability (01.06.2012)
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Journal Article
Circuit-aging modeling based on dynamic MOSFET degradation and its verification
Rohbani, Nezam, Miyamoto, Hidenori, Kikuchihara, Hideyuki, Navarro, Dondee, Maiti, Tapas Kumar, Chenyue Ma, Miura-Mattausch, Mitiko, Miremadi, Seyed-Ghassem, Mattausch, Hans Jurgen
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)
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Conference Proceeding
CFCET: A hardware-based control flow checking technique in COTS processors using execution tracing
Rajabzadeh, Amir, Miremadi, Seyed Ghassem
Published in Microelectronics and reliability (01.05.2006)
Published in Microelectronics and reliability (01.05.2006)
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Journal Article
Dependability evaluation of Altera FPGA-based embedded systems subjected to SEUs
Zarandi, Hamid R., Miremadi, Seyed Ghassem
Published in Microelectronics and reliability (01.02.2007)
Published in Microelectronics and reliability (01.02.2007)
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Journal Article
A SEU-protected cache memory-based on variable associativity of sets
Zarandi, Hamid Reza, Miremadi, Seyed Ghassem
Published in Reliability engineering & system safety (01.11.2007)
Published in Reliability engineering & system safety (01.11.2007)
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Journal Article
Conference Proceeding